1081 - 1087 |
Characterizing field emission from individual carbon nanotubes at small distances Hii KF, Vallance RR, Chikkamaranahalli SB, Menguc MP, Rao AM |
1088 - 1093 |
Characteristics of HfO2 thin films deposited by plasma-enhanced atomic layer deposition, using O-2 plasma and N2O plasma Kim S, Kim J, Choi J, Kang HS, Jeon H, Bae C |
1094 - 1097 |
Neutron irradiation effects in undoped n-AlGaN Polyakov AY, Smirnov NB, Govorkov AV, Markov AV, Kolin NG, Boiko VM, Merkurisov DI, Pearton SJ |
1098 - 1103 |
Band structures of double-walled carbon nanotubes Ho YH, Ho GW, Wu SJ, Lin MF |
1104 - 1108 |
Annealing effect on the surface plasmon resonance absorption of a Ti-SiO2 nanoparticle composite Zhao JP, Chen ZY, Cai XJ, Rabalais JW |
1109 - 1116 |
Fabrication of ultrathin (similar to 100 nm), low-index nanoporous silica films for photonic devices: Role of substrate adhesion on the film thickness Ojha M, Gill WN, Plawsky JL, Cho W |
1117 - 1122 |
Self-aligned via and trench for metal contact in III-V semiconductor devices Zheng JF, Demir HV, Sabnis VA, Fidaner O, Harris JS, Miller DAB |
1123 - 1126 |
Fabrication of magnesium-doped gallium nitride nanorods and microphotoluminescence characteristics Lai FI, Kuo SY, Chang YH, Huang HW, Chang CW, Yu CC, Lin CF, Kuo HC, Wang SC |
1127 - 1130 |
X-ray diffraction analysis of interdiffusion in AlxIn1-xAsySb1-y/GaSb multilayers Forrest RL, Stokes DW, Li JH, Lukic R, Golding TD |
1131 - 1138 |
Progress in the physical modeling of carrier illumination Dortu F, Clarysse T, Loo R, Pawlak B, Delhougne R, Vandervorst W |
1139 - 1146 |
Towards nondestructive carrier depth profiling Clarysse T, Vandervorst W, Bakshi M, Nicolaides L, Salnik A, Opsal J |
1147 - 1150 |
Photoelectron spectroscopic analysis of Hf-silicate/SiO2/Si stacks deposited by atomic layer chemical vapor deposition Kim J, Yong KJ |
1151 - 1155 |
Thermal annealing effects on the structure and electrical properties of Al2O3 gate dielectrics on fully depleted SiGe on insulator Di ZF, Zhang M, Liu WL, Shen QW, Luo SH, Song ZT, Lin CL, Chu PK |
1156 - 1161 |
Quantum size effect of valence band plasmon energies in Si and SnOx nanoparticles Nienhaus H, Kravets V, Koutouzov S, Meier C, Lorke A, Wiggers H, Kennedy MK, Kruis FE |
1162 - 1177 |
Integrated model for chemically enhanced physical vapor deposition of tantalum nitride-based films Li N, Brenner PW, Ruzic DN |
1178 - 1184 |
Investigation of thermophoretic protection with speed-controlled particles at 100, 50, and 25 mTorr Kim JH, Fissan H, Asbach C, Yook SJ, Pui DYH, Orvek KJ |
1185 - 1189 |
Approach to optimizing n-SiC Ohmic contacts by replacing the original contacts with a second metal Ervin MH, Jones KA, Lee U, Wood MC |
1190 - 1196 |
Vertically aligned carbon nanotube field emission devices fabricated by furnace thermal chemical vapor deposition at atmospheric pressure Wei S, Kang WP, Davidson JL, Choi BK, Huang JH |
1197 - 1201 |
Reactive ion etch damage on GaN and its recovery Fan Q, Chevtchenko S, Ni XF, Cho SJ, Yun F, Morkoc H |
1202 - 1209 |
Monte Carlo simulation of process parameters in electron beam lithography for thick resist patterning Zhou JY, Yang XM |
1210 - 1214 |
Visible light photocatalysis with nitrogen-doped titanium dioxide nanoparticles prepared by plasma assisted chemical vapor deposition Buzby S, Barakat MA, Lin H, Ni C, Rykov SA, Chen JG, Shah SI |
1215 - 1218 |
Sub-10-nm high aspect ratio patterning of ZnO in a 500 mu m main field Saifullah MSM, Subramanian KRV, Anderson D, Kang DJ, Huck WTS, Jones GAC, Welland ME |
1219 - 1225 |
Data processing system for maskless lithography toward 65 nm node and below Hoshino H, Machida Y |
1226 - 1229 |
Ultrahigh-aspect-ratio, SiO2 deeply etched periodic structures with smooth surfaces for photonics applications Hosomi K, Kikawa T, Goto S, Yamada H, Katsuyama T, Arakawa Y |
1230 - 1233 |
Nanostructure evolution of YBa2Cu3Ox thin films grown by pulsed-laser glancing-angle deposition Wang HH, Zhao YP |
1234 - 1237 |
Lithographic characterization of the flare in the Berkeley 0.3 numerical aperture extreme ultraviolet microfield optic Cain JP, Naulleau PP, Gullikson EM, Spanos CJ |
1238 - 1247 |
Damage of ultralow k materials during photoresist mask stripping process Hua XF, Kuo MS, Oehrlein GS, Lazzeri P, Iacob E, Anderle M, Inoki CK, Kuan TS, Jiang P, Wu WL |
1248 - 1253 |
Directed growth of horizontal silicon nanowires by laser induced decomposition of silane Abed H, Charrier A, Dallaporta H, Safarov V, Jamgotchian H, Tonneau D |
1254 - 1258 |
Analysis of atomic diffusion mechanism of interconnect voiding failure caused by stress-induced migration Aoyagi M |
1259 - 1265 |
Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions Pelucchi E, Kumar D, Lazzarino M, Rubini S, Franciosi A |
1266 - 1270 |
Fabrication and characteristics of P-channel silicon-oxide-nitride-oxide-silicon flash memory device based on bulk fin shaped field effect transistor structure Cho IH, Park TS, Choe JD, Cho HJ, Park D, Shin H, Park BG, Lee JD, Lee JH |
1271 - 1277 |
Experimental investigation of tunnel oxide thickness on charge transport through Si nanocrystal dot floating gate memories Punchaipetch P, Ichikawa K, Uraoka Y, Fuyuki T, Tomyo A, Takahashi E, Hayashi T |
1278 - 1282 |
Fabrication of organic light-emitting devices on flexible substrates using a combined roller imprinting and photolithography-patterning technique Kao PC, Chu SY, Zhan CY, Hsu LC, Liao WC |
1283 - 1291 |
Implementation of an imprint damascene process for interconnect fabrication Schmid GM, Stewart MD, Wetzel J, Palmieri F, Hao JJ, Nishimura Y, Jen K, Kim EK, Resnick DJ, Liddle JA, Willson CG |
1292 - 1296 |
Ion and neutral transportation consideration in etching of thin Si3N4 in high aspect ratio structures for aspect ratio independent etching Bai KH, Chi KK, Kim MC |
1297 - 1302 |
Oxygen pressure dependence of copper ion transport in SiO2 dielectrics Shepherd LP, Mathew A, McCandless BE, Willis BG |
1303 - 1307 |
Thermally stable AlGaN/GaN heterostructure field-effect transistor with IrO2 gate electrode Jeon CM, Park KY, Lee JH, Lee JH, Lee JL |
1308 - 1310 |
GaAsNSb-base GaAs heterojunction bipolar transistor with a low turn-on voltage Lew KL, Yoon SF, Wang H, Wicaksono S, Gupta JA, McAlister SP |
1311 - 1317 |
Deposition of nanostructured Si-C-N superhard coatings by rf magnetron sputtering Mishra SK, Gaur H, Rupa PKP, Pathak LC |
1318 - 1321 |
Growth and characterization of a high-purity ZnO nanoneedles film prepared by microwave plasma deposition Lin TC, Wang CY, Chan LH, Hsiao DQ, Shih HC |
1322 - 1326 |
dc thermal plasma synthesis and properties of zinc oxide nanorods Liao SC, Lin HF, Hung SW, Hu CT |
1327 - 1332 |
Growth mechanism and diffusion barrier property of plasma-enhanced atomic layer deposition Ti-Si-N thin films Park JS, Kang SW, Kim H |
1333 - 1336 |
Oxidation of silicon nanowires Shir D, Liu BZ, Mohammad AM, Lew KK, Mohney SE |
1337 - 1340 |
Bias-enhanced lateral photoelectrochemical etching of GaN for the fabrication of undercut micromachined system structures Yang B, Fay P |
1341 - 1343 |
Interface configuration and Fermi-level pinning of fully silicided gate and high-K dielectric stack Joo MS, Park CS, Cho BJ, Balasubramanian N, Kwong DL |
1344 - 1352 |
Modeling dual inlaid feature construction Stout PJ, Rauf S, Nagy A, Ventzek PLG |
1353 - 1357 |
High current field emission behavior of carbon nanofiber film: Adsorbate effects Park KH, Lee S, Koh KH |
1358 - 1361 |
Field emission from amorphous GaN deposited on Si by dc sputtering Ye F, Xie EQ, Pan XJ, Li H, Duan HG, Jia CW |
1362 - 1364 |
Field emission from multiwall carbon nanotubes prepared by electrodeposition without the use of a dispersant Lyth SM, Oyeleye F, Curry RJ, Davis J, Silva SRP |
1365 - 1370 |
Modeling the suppression of boron diffusion in Si/SiGe due to carbon incorporation Rizk S, Haddara YM, Sibaja-Hernandez A |
1371 - 1376 |
Two-dimensional carrier profiling on operating Si metal-oxide semiconductor field-effect transistor by scanning capacitance microscopy Kimura K, Kobayashi K, Yamada H, Matsushige K, Usuda K |
1377 - 1383 |
Ultraviolet curing imprint lithography on flexible indium tin oxide substrates Chung YC, Chiu YH, Liu HJ, Chang YF, Cheng CY, Hong FCN |
1384 - 1397 |
Nanoscale device architecture to reduce leakage currents through quantum-mechanical simulation Sarab AAP, Datta D, Dasgupta S |
1398 - 1401 |
Effect of film thickness on the electrical properties of tantalum nitride thin films deposited on SiO2/Si substrates for II-type attenuator applications Cuong ND, Kim DJ, Kang BD, Kim CS, Yoon SG |
1402 - 1404 |
Direct nanoimprint of inorganic-organic hybrid glass Okinaka M, Tsukagoshi K, Aoyagi Y |
1405 - 1408 |
Formation of nickel nanoparticles on amorphous silicon thin film and its effect on crystallization Lee SB, Choi DK, Phillipp F, Kim YM, Kim YJ |
1409 - 1412 |
Cleaning silicon nitride gratings with liquid immersion Robertson-Tessi M, Wild RJ, Cronin AD, Savas T |
1413 - 1416 |
Observation of quantum interference effect in solids Tavkhelidze A, Bibilashvili A, Jangidze L, Shimkunas A, Mauger P, Rempfer GF, Almaraz L, Dixon T, Kordesch ME, Katan N, Walitzki H |
1417 - 1422 |
Role of reactive surface oxygen in causing enhanced copper ionization in a low-k polymer Achanta RS, Gill WN, Plawsky JL, Haase G |
1423 - 1427 |
Emission characteristics of printed carbon nanotube cathodes after laser treatment Hosono A, Shiroishi T, Nishimura K, Abe F, Shen ZY, Nakata S, Okuda S |
1428 - 1431 |
Thermal stability of chemical vapor deposition grown W and WNx thin films in low-k integration structure Jeon S, Yong K, Park SG, Rhee SW |
1432 - 1435 |
Effects of NH3 pulse plasma on atomic layer deposition of tungsten nitride diffusion barrier Lee CW, Kim YT |
1436 - 1439 |
Fabrication and characterization of Spindt-type field emission arrays coated with ZrC thin films Li HY, Ding MQ, Feng JJ, Li XH, Bai GD, Zhang FQ |
1440 - 1443 |
Formation of nanostructured cobalt wires with Chinese caterpillar type structure Huang FT, Liu RS, Hu SF, Lee CL, Li AK |
1444 - 1448 |
Self-organized nanodot formation on InP(100) by argon ion sputtering at normal incidence Tan SK, Wee ATS |
1449 - 1454 |
Influence of hydrogen plasma surface treatment of Si substrate on nickel silicide formation Vengurlekar A, Balasubramanian S, Ashok S, Theodore D, Chi DZ |
1455 - 1459 |
Large area all-dielectric planar chiral metamaterials by electron beam lithography Zhang W, Potts A, Bagnall DM, Davidson BR |
1460 - 1463 |
Characteristics of the nanoscale titanium film deposited by plasma enhanced chemical vapor deposition and comparison of the film properties with the film by physical vapor deposition Lee JW, Kim SH, Kwak NJ, Lee YJ, Sohn HC, Kim JW, Sun HJ |
1464 - 1469 |
Alternating phase shifted scattering bars for low k(1) trench pattering Mehta SS, Kumar R, Singh N, Suda H, Kubota T, Kimura Y, Kinoshita H, Wong TKS, Wei J |
1478 - 1478 |
An International Journal Devoted to Microelectronics and Nanometer Structures - Preface Sullivan G |
1479 - 1482 |
Gate dielectric on compound semiconductors by molecular beam epitaxy Droopad R, Rajagopalan K, Abrokwah J, Passlack M |
1483 - 1487 |
ErAs island-stacking growth technique for engineering textured Schottky interfaces Zimmerman JD, Gossard AC, Young AC, Miller MP, Brown ER |
1488 - 1491 |
Molecular beam epitaxial growth of osmium silicides Cottier RJ, Amir FZ, Zhao W, Hossain K, Gorman BP, Golding TD, Anibou N, Donner W |
1492 - 1495 |
Development of 6.00 A graded metamorphic buffer layers and high performance In0.86Al0.14As/In0.86Ga0.14As heterojunction bipolar transistor devices Cavus A, Sandhu R, Monier C, Cox C, Pascua D, Gutierrez-Aitken A, Noori A, Hayashi S, Goorsky M |
1496 - 1499 |
Long-wavelength semiconductor saturable absorber mirrors using metamorphic InP grown on GaAs by molecular beam epitaxy Suomalainen S, Vainionpaa A, Tengvall O, Hakulinen T, Herda R, Karirinne S, Guina M, Okhotnikov OG |
1500 - 1504 |
Reaction of molecular beam epitaxial grown AIN nucleation layers with SiC substrates Hoke WE, Torabi A, Hallock RB, Mosca JJ, Kennedy TD |
1505 - 1509 |
Growth of thin AllnN/GalnN quantum wells for applications to high-speed intersubband devices at telecommunication wavelengths Cywinski G, Skierbiszewski C, Fedunieiwcz-Zmuda A, Siekacz M, Nevou L, Doyennette L, Tchernycheva M, Julien FH, Prystawko P, Krysko M, Grzanka S, Grzegory I, Presz A, Domagala JZ, Smalc J, Albrecht M, Remmele T, Porowski S |
1510 - 1513 |
Spin-polarized vertical-cavity surface-emitting laser: Epitaxial growth issues and device properties Holub M, Shin J, Chakrabarti S, Bhattacharya P |
1514 - 1518 |
Effects of plasma conditions on properties of ZnO films grown by plasma-assisted molecular beam epitaxy Lee WCT, Miller P, Reeves RJ, Durbin SM |
1519 - 1522 |
High performance self-organized InGaAs quantum dot lasers on silicon Mi Z, Yang J, Bhattacharya P, Chan PKL, Pipe KP |
1523 - 1526 |
Size evolution of site-controlled InAs quantum dots grown by molecular beam epitaxy on prepatterned GaAs substrates Atkinson P, Bremner SP, Anderson D, Jones GAC, Ritchie DA |
1527 - 1531 |
Growth optimization of InGaAs quantum wires for infrared photodetector applications Tsai CL, Xu CF, Hsieh KC, Cheng KY |
1532 - 1535 |
InAs/GaAs quantum-dot infrared photodetectors grown by molecular beam epitaxy Pal D, Walker J, Towe E |
1536 - 1539 |
Hydrogen limited nitrogen incorporation in III-V dilute nitrides grown by rf nitrogen plasma assisted chemical beam epitaxy Fotkatzikis A, Freundlich A |
1540 - 1543 |
Calcium impurities in enhanced-depletion-width GaInNAs grown by molecular-beam epitaxy Ptak AJ, Friedman DJ, Kurtz S, Reedy RC, Young M, Jackrel DB, Yuen HB, Bank SR, Wistey MA, Harris JS |
1544 - 1547 |
Molecular beam epitaxy of InP-based alloys for long-wavelength vertical cavity lasers Buell DA, Feezell D, Finland BO, Coldren L |
1548 - 1552 |
Molecular beam epitaxy growth of midinfrared "W" light emitting diodes on InAs Kuznetsov VV, Wicks GW |
1553 - 1555 |
Influence of Si doping on the performance of quantum dots-in-well photodetectors Attaluri RS, Annamalai S, Posani KT, Stintz A, Krishna S |
1556 - 1558 |
Nonstoichiometric growth and cluster formation in low temperature grown GaAsSb for terahertz-applications Sigmund J, Pavlidis D, Hartnagel HL, Benker N, Fuess H |
1559 - 1563 |
Fabrication and molecular beam epitaxy regrowth of first-order, high contrast AlGaAs/GaAs gratings Wang CS, Morrison GB, Skogen EJ, Coldren LA |
1564 - 1567 |
High performance GaAsSb/InP double heterojunction bipolar transistors grown-by gas-source molecular beam epitaxy Wu BR, Chu-Kung BF, Feng MT, Cheng KY |
1568 - 1571 |
Study of the homoepitaxial growth of GaAs on (631) oriented substrates Cruz-Hernandez E, Rojas-Ramirez JS, Vazquez-Lopez C, Lopez-Lopez M, Pulzara-Mora A, Mendez-Garcia VH |
1572 - 1576 |
Atomic force microscopy study of sapphire surfaces annealed with a H2O flux from a baffled molecular-beam epitaxy effusion cell loaded with Al(OH)(3) Oye MM, Hurst JB, Shahrjerdi D, Kulkarni NN, Muller A, Beck AL, Sidhu R, Shih CK, Banerjee SK, Campbell JC, Holmes AL, Mattord TJ, Reifsnider JM |
1577 - 1580 |
Multistep fabrication of self-assembled unstrained quantum dashes Ukhanov AA, Bracker AS, Boishin G, Culbertson JC |
1581 - 1586 |
Strain relaxation in the growth of planar InAs Eyink KG, Grazulis L, Pitz JJ, Shank J, Mahalingam K |
1587 - 1590 |
Nanoscale selective area epitaxy of C-60 crystals on GaAs by molecular beam epitaxy Nishinaga J, Aihara T, Toda T, Matsutani F, Horikoshi Y |
1591 - 1594 |
Structural and optical characterization of GaNAs layers grown by molecular beam epitaxy Pulzara-Mora A, Melendez-Lira M, Falcony-Guajardo C, Lopez-Lopez M, Vidal MA, Jimenez-Sandoval S, Aguilar-Frutis MA |
1595 - 1598 |
Photoresponsivity of ZnO Schottky barrier diodes Oh DC, Suzuki T, Hanada T, Yao T, Makino H, Ko HJ |
1599 - 1603 |
Hydrogen-plasma assisted molecular beam epitaxial growth of high-purity InAs Chen YQ, Unuvar T, Moscicka D, Wang WI |
1604 - 1606 |
Optical characterization of In0.27Ga0.73Sb and ln(x)Al(1-x)As(y)Sb(1-y) pitaxial layers for development of 6.2-angstrom-based heterojunction bipolar transistors Glaser ER, Magno R, Shanabrook BV, Tischler JG |
1607 - 1612 |
Molecular beam epitaxy grown In1-xAlxSb/InSb structures for infrared detectors Klin O, Klipstein PC, Jacobsohn E, Saguy E, Shtrichman I, Raizman A, Weiss E |
1613 - 1616 |
cw midinfrared "W" diode and interband cascade lasers Canedy CL, Bewley WW, Kim CS, Kim M, Lindle JR, Vurgaftman I, Meyer JR |
1617 - 1621 |
Gain saturation and carrier distribution effects in molecular beam epitaxy grown GaAsSb/GaAs quantum well lasers Yu SQ, Jin X, Johnson SR, Zhang YH |
1622 - 1625 |
Narrow band gap InGaSb, InAlAsSb alloys for electronic devices Magno R, Glaser ER, Tinkham BP, Champlain JG, Boos JB, Ancona MG, Campbell PM |
1626 - 1629 |
Molecular beam epitaxy grown 0.6 eV n/p/n lnPAs/InGaAs/InAlAs double heterostructure thermophotovoltaic devices using carbon as the p-type dopant Wernsman B, Bird T, Sheldon M, Link S, Wehrer R |
1630 - 1633 |
Carbon-doped high-mobility hole gases on (001) and (110) GaAs Gerl C, Schmult S, Wurstbauer U, Tranitz HP, Mitzkus C, Wegscheider W |
1634 - 1638 |
Molecular, beam epitaxy and morphological studies of homoepitaxial layers on chemical mechanical polished InSb(100) and InSb(111)B substrates Vangala SR, Qian X, Grzesik M, Santeufemio C, Goodhue WD, Allen LP, Dallas G, Dauplaise H, Vaccaro K, Wang SQ, Bliss D |
1639 - 1643 |
Tunneling through MnAs particles at a GaAs p(+)n(+) junction Bloom FL, Young AC, Myers RC, Brown ER, Gossard AC, Gwinn EG |
1644 - 1648 |
Structural and magnetic behavior of transition metal doped InN grown by molecular beam epitaxy Rajaram R, Ney A, Farrow RFC, Parkin SSP, Solomon GS, Harris JS |
1649 - 1655 |
Formation and optical properties of stacked CdSe self-assembled quantum dots on ZnxCdyMg1-x-ySe barriers Perez-Paz MN, Lu H, Shen AD, Tamargo MC |
1656 - 1659 |
Growth of high quality InAs quantum-dot multilayer structures on InP for infrared photodetector applications Zhang ZH, Cheng KY |
1660 - 1664 |
Formation and property of InSb self-assembled quantum dots on GaAsSb lattice matched to InP Wu BR, Cheng KY, Xu CF, Hsieh KC |
1665 - 1667 |
Thin-capping-and-regrowth molecular beam epitaxial technique for quantum dots and quantum-dot molecules Suraprapapich S, Thainoi S, Kanjanachuchai S, Panyakeow S |
1668 - 1670 |
Molecular beam epitaxial growth of ZnMgO/ZnO/ZnMgO single quantum well structure on Si(111) substrate Fujita M, Suzuki R, Sasajima M, Kosaka T, Deesirapipat Y, Horikoshi Y |
1671 - 1675 |
Growth of GaN films on GaAs substrates in an As-free environment Maksimov O, Fisher P, Du H, Acord JD, Weng X, Skowronski M, Heydemann VD |