1 - 1 |
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII) - 22-26 May 2006 - Phoenix Seagaia Resort, Miyazaki, Japan - Editorial introduction Onabe K, Usui A, Kobayashi N |
2 - 7 |
Fundamental chemistry and modeling of group-III nitride MOVPE Creighton JR, Wang GT, Coltrin ME |
8 - 11 |
In situ scanning tunnelling microscopy during metal-organic vapour phase epitaxy Pristovsek M, Rahmer B, Breusig M, Kremzow R, Richter W |
12 - 17 |
Atomic scale analysis of MOVPE grown heterostructures by X-ray crystal truncation rod scattering measurement Tabuchi M, Takeda Y |
18 - 22 |
MOVPE growth investigations of doping and ordering in AlGaAs and GaInP with reflectance anisotropy spectroscopy Krahmer C, Philippens M, Schubert M, Streubel K |
23 - 27 |
AlGaInP growth parameter optimisation during MOVPE for opto-electronic devices Zorn M, Trepk T, Schenk T, Zettler JT, Weyers M |
28 - 31 |
Modeling and characterization of AlGaInAs and related materials using selective area growth by metal-organic vapor-phase epitaxy Decobert J, Dupuis N, Lagree PY, Lagay N, Ramdane A, Ougazzaden A, Poingt F, Cuisin C, Kazmierski C |
32 - 36 |
Non-linear kinetic analysis on GaAs selective area MOVPE combined with macro-scale analysis to extract major reaction mechanism Song HZ, Im IT, Sugiyama M, Nakano Y, Shimogaki Y |
37 - 40 |
Vapor phase diffusion and surface diffusion combined model for InGaAsP selective area metal-organic vapor phase epitaxy Shioda T, Sugiyama M, Shimogaki Y, Nakano Y |
41 - 45 |
Anomalous behavior of phase separation of InGaAsP on GaAs substrates grown by MOVPE Ono K, Takemi M |
46 - 49 |
Homoepitaxial growth rate measurement using in situ reflectance anisotropy spectroscopy Kaspari C, Pristovsek M, Richter W |
50 - 53 |
In situ monitoring of the growth procedure of InAs layer by spectral reflectance Ahn E, Lee YS, Kim J, Kim YD, Yoon E |
54 - 58 |
Surface science studies including low-temperature RDS on MOCVD-prepared, As-terminated Si(100) surfaces Bork T, McMahon WE, Olson JM, Hannappel T |
59 - 63 |
Reactor-scale uniformity of selective-area performance in InGaAsP system Onitsuka R, Shioda T, Song HZ, Sugiyama M, Shimogaki Y, Nakano Y |
64 - 68 |
Compound semiconductors grown on porous alumina substrate as a novel hydrogen permeation membrane Sato M |
69 - 72 |
Effect of Li doping on photoluminescence from Er, O-codoped GaAs Uki D, Ohnishi H, Yamaguchi T, Takemori Y, Koizumi A, Fuchi S, Ujihara T, Takeda Y |
73 - 75 |
Micro-photoluminescence study of nitrogen delta-doped GaAs grown by metalorganic vapor phase epitaxy Endo Y, Tanioka K, Hijikata Y, Yaguchi H, Yoshida S, Yoshita M, Akiyama H, Ono W, Nakajima F, Katayama R, Onabe K |
76 - 80 |
Role of the V-III ratio and growth rate in decomposition of In0.27Ga0.73P/GaP grown by MOVPE Novak J, Hasenohrl S, Vavra I, Sedlackova K, Kucera M, Radnoczi G |
81 - 84 |
Growth and characterization of BGaAs and BInGaAs epilayers on GaAs by MOVPE Rodriguez P, Auvray L, Dumont H, Dazord J, Monteil Y |
85 - 89 |
High-resolution depth profile of the InGaP-on-GaAs heterointerface by FE-AES and its relationship to device properties Ichikawa O, Fukuhara N, Hata M, Nakano T, Sugiyama M, Shimogaki Y, Nakano Y |
90 - 93 |
Atomic layer epitaxy of MnAs on GaAs(001) Ozeki M, Haraguchi T, Fujita A |
94 - 97 |
Selective area etching of InP with CBr4 in MOVPE Ebert C, Levkoff J, Roberts J, Seiler J, Wanamaker C, Pinnington T |
98 - 102 |
Morphology of interior interfaces in the novel dilute nitride Ga(NAsP)/GaP material system Oberhoff S, Kunert B, Torunski T, Volz K, Stolz W |
103 - 106 |
MOVPE growth and optical characterization of GaPN films using tertiarybutylphosphine (TBP) and 1,1-dimethylhydrazine (DMHy) Nakajima F, Ono W, Kuboya S, Katayama R, Onabe K |
107 - 110 |
Correlation between Raman intensity of the N-related local vibrational mode and N content in GaAsN strained layers grown by MOVPE Panpech P, Vijarnwannaluk S, Sanorpim S, Ono W, Nakajima F, Katayama R, Onabe K |
111 - 115 |
Structural investigation of InGaAsN films grown on pseudo-lattice-matched InGaAs substrates by metalorganic vapor phase epitaxy Kongjaeng P, Sanorpim S, Yamamoto T, Ono W, Nakajima F, Katayama R, Onabe K |
116 - 120 |
Optical properties of GaTnNAs quantum wells on misoriented substrates grown by MOVPE Ishizuka T, Doi H, Katsuyama T, Hashimoto J, Nakayama M |
121 - 125 |
MOVPE growth conditions of the novel direct band gap, diluted nitride Ga(NAsP) material system pseudomorphically strained on GaP-substrate Kunert B, Volz K, Koch J, Stolz W |
126 - 130 |
Influence of annealing on the optical and structural properties of dilute N-containing III/V semiconductor hetero structures Volz K, Koch J, Kunert B, Nemeth I, Stolz W |
131 - 134 |
Micro-Raman study on the improvement of luminescence efficiency of GaAsN alloys Tanioka K, Endo Y, Hijikata Y, Yaguchi H, Yoshida S, Yoshita M, Akiyama H, Onabe K |
135 - 139 |
Substrate-surface orientation dependence of N content in MOVPE growth of GaAsN films on GaAs Ono W, Nakajima F, Sanorpim S, Katayama R, Onabe K |
140 - 144 |
Post-growth thermal annealing of high N-content GaAsN by MOVPE and its effect on strain relaxation Klangtakai P, Sanorpim S, Yoodee K, Ono W, Nakajima F, Katayama R, Onabe K |
145 - 149 |
Optical investigations on the surfactant effects of Sb on InGaAsN multiple quantum wells grown by MOVPE Chen WC, Su YK, Chuang RW, Tsai MC, Cheng KY, Wang YS |
150 - 153 |
Growth and post-growth rapid thermal annealing of InGaPN on GaP grown by metalorganic vapor phase epitaxy Sanorpim S, Nakajima F, Nakadan N, Kimura T, Katayama R, Onabe K |
154 - 158 |
Growth of strained GaAs1-ySby layers using metalorganic vapor phase epitaxy Khandekar AA, Yeh JY, Mawst LJ, Song XY, Babcock SE, Kuech TF |
159 - 162 |
Segregation and desorption of antimony in InP (001) in MOVPE Weeke S, Leyer M, Pristovsek M, Brunner F, Weyers M, Richter W |
163 - 167 |
Electrical properties of undoped and doped MOVPE-grown InAsSb Krug T, Botha L, Shamba P, Baisitse TR, Venter A, Engelbrecht JAA, Botha JR |
168 - 171 |
Bubbler for constant vapor delivery of a solid chemical Andre CL, El-Zein N, Tran N |
172 - 175 |
Safer alternative liquid germanium precursors for relaxed graded SiGe layers and strained silicon by MOVPE Shenai DV, DiCarlo RL, Power MB, Amamchyan A, Goyette RJ, Woelk E |
176 - 180 |
Stable vapor transportation of solid sources in MOVPE of III-V compound semiconductors Shenai-Khatkhate DV, DiCarlo RL, Marsman CJ, Polcari RF, Ware RA, Woelk E |
181 - 185 |
On the pyrophoricity, safety, and handling of metalorganic chemicals Andre CL, Bisinger E, El-Zein N, Luttmer A, Van Mierlo MJA, Wissink HG |
186 - 189 |
Systematic theoretical investigations InxGa1-xN thin films of compositional inhomogeneity in on GaN(0001) Ito T, Inahama S, Akiyama T, Nakamura K |
190 - 192 |
Analysis of compositional instability of InGaN by Monte Carlo simulation Kangawa Y, Kakimoto K, Ito T, Koukitu A |
193 - 197 |
Cross-sectional spatially resolved cathodoluminescence study of cubic GaN films grown by metalorganic vapor phase epitaxy on free-standing (001) 3C-SiC and GaAs substrates Onuma T, Nozaka T, Yamaguchi H, Suzuki T, Chichibu SF |
198 - 201 |
GaN growth on 150-mm-diameter (111) Si substrates Ubukata A, Ikenaga K, Akutsu N, Yamaguchi A, Matsumoto K, Yamazaki T, Egawa T |
202 - 206 |
Growth optimization during III-nitride multiwafer MOVPE using realtime curvature, reflectance and true temperature measurements Brunner F, Hoffmann V, Knauer A, Steimetz E, Schenk T, Zettler JT, Weyers M |
207 - 210 |
Mg doping in (1(1)over-bar01)GaN grown on a 7 degrees off-axis (001)Si substrate by selective MOVPE Hikosaka T, Koide N, Honda Y, Yamaguchi M, Sawaki N |
211 - 214 |
Influence of V/III flux ratio on electrical properties of AlInGaN/Gan heterostructures grown by MOCVD Yu TJ, Pan YB, Yang ZJ, Xu K, Zhang GY |
215 - 218 |
High-speed growth of AlGaN having high-crystalline quality and smooth surface by high-temperature MOVPE Kato N, Sato S, Sumii T, Fujimoto N, Okada N, Imura M, Balakrishnan K, Iwaya M, Kamiyama S, Amano H, Akasaki I, Maruyama H, Noro T, Takagi T, Bandoh A |
219 - 222 |
Growth and characterization of 380-nm InGaN/AlGaN LEDs grown on patterned sapphire substrates Horng RH, Wang WK, Huang SC, Huang SY, Lin SH, Lin CF, Wuu DS |
223 - 227 |
Polarities of GaN films and 3C-SiC intermediate layers grown on (111) Si substrates by MOVPE Komiyama J, Abe Y, Suzuki S, Nakanishi H |
228 - 231 |
Two-step growth of m-plane GaN epilayer on LiAlO2 (100) by metal-organic chemical vapor deposition Liu CX, Xie ZL, Han P, Liu B, Li LA, Zou J, Zhou SM, Bai LH, Chen ZH, Zhang R, Zheng YD |
232 - 234 |
Effect of low-temperature GaN buffer layer on the crystalline quality of subsequent GaN layers grown by MOVPE Hoshino K, Yanagita N, Araki M, Tadatomo K |
235 - 238 |
Effects of doping on the crystalline quality and composition distribution in InGaN/GaN structure grown by MOCVD Ran JX, Wang XL, Hu GX, Li JP, Wang BZ, Xiao HL, Wang JX, Zeng YP, Li JM, Wang ZG |
239 - 242 |
Si doping of metal-organic chemical vapor deposition grown gallium nitride using ditertiarybutyl silane metal-organic source Fong WK, Leung KK, Surya C |
243 - 245 |
In situ X-ray diffraction during MOCVD of III-nitrides: An optimized wobbling compensating evaluation algorithm Simbrunner C, Schmidegg K, Bonanni A, Kharchenko A, Bethke J, Woitok J, Lischka K, Sitter H |
246 - 250 |
Kinetics of persistent photoconductivity in InGaN epitaxial films grown by MOCVD Hung H, Chen CH, Chang SJ, Kuan H, Lin RM, Liu CH |
251 - 253 |
An investigation of thermal conductivity of nitride-semiconductor nanostructures by molecular dynamics simulation Kawamura T, Kangawa Y, Kakimoto K |
254 - 256 |
Room temperature ferromagnetism of GaN : Mn thin films grown by low pressure metal-organic chemical vapor deposition by mn periodic delta-doping Chen ZT, Su YY, Yang ZJ, Zhang B, Xu K, Yang XL, Pan YB, Zhang GY |
257 - 260 |
Epitaxial lateral overgrowth of AlN on trench-patterned AlN layers Imura M, Nakano K, Narita G, Fujimoto N, Okada N, Balakrishnan K, Iwaya M, Kamiyama S, Amano H, Akasaki I, Noro T, Takagi T, Bandoh A |
261 - 264 |
Epitaxial lateral growth of m-plane GaN and Al0.18Ga0.82N on m-plane 4H-SiC and 6H-SiC substrates Kawashima T, Nagai T, Iida D, Miura A, Okadome Y, Tsuchiya Y, Iwaya M, Kamiyama S, Amano H, Akasaki I |
265 - 267 |
Epitaxial lateral overgrowth of AlxGa1-xN (x > 0.2) on sapphire and its application to UV-B-light-emitting devices Iida K, Kawashima T, Iwaya M, Kamiyama S, Amano H, Akasaki I, Bandoh A |
268 - 271 |
Growth of low dislocation density GaN using transition metal nitride masking layers Moram MA, Kappers MJ, Barber ZH, Humphreys CJ |
272 - 275 |
Dislocation analysis in homoepitaxial GaInN/GaN light emitting diode growth Detchprohm T, Xia Y, Xi Y, Zhu M, Zhao W, Li Y, Schubert EF, Liu L, Tsvetkov D, Hanser D, Wetzel C |
276 - 280 |
Reduction of threading dislocation density in Al0.12Ga0.88N epilayers by a multistep technique Lang T, Odnoblyudov MA, Bougrov VE, Suihkonen S, Svensk O, Torma PT, Sopanen M, Lipsanen H |
281 - 283 |
Effects of buffer layers on the stress and morphology of GaN epilayer grown on Si substrate by MOCVD Liu Z, Wang XL, Wang JX, Hu GX, Guo LC, Li JP, Li JM, Zeng YP |
284 - 287 |
TEM analysis of an interface layer formed by the anti-surfactant treatment on a GaN template Kuwano N, Hijikuro M, Hata S, Takeuchi M, Aoyagi Y |
288 - 292 |
Microstructure in nonpolar m-plane GaN and AlGaN films Nagai T, Kawashima T, Imura M, Iwaya M, Kamiyama S, Amano H, Akasaki I |
293 - 296 |
Large misorientation of GaN films grown on r-plane sapphire substrates by metalorganic vapor-phase epitaxy Kusakabe K, Ando S, Ohkawa K |
297 - 299 |
Inversion domains in AlGaN films grown on patterned sapphire substrate Kawamichi S, Nishino K, Sumiyoshi K, Tsukihara M, Yan FW, Sakai S |
300 - 304 |
Al0.17Ga0.83N film with middle temperature-intermediate layer grown on trenched sapphire substrate by MOCVD Sumiyoshi K, Tsukihara M, Kataoka K, Kawamichi S, Okimoto T, Nishino K, Naoi Y, Sakai S |
305 - 309 |
Investigation of surface defect structure originating in dislocations in AlGaN/GaN epitaxial layer grown on a Si substrate Sasaki H, Kato S, Matsuda T, Sato Y, Iwami M, Yoshida S |
310 - 315 |
Threading dislocations in heteroepitaxial AlN layer grown by MOVPE on SiC (0001) substrate Taniyasu Y, Kasu M, Makimoto T |
316 - 319 |
BGaN materials on GaN/sapphire substrate by MOVPE using N-2 carrier gas Ougazzaden A, Gautier S, Sartel C, Maloufi N, Martin J, Jomard F |
320 - 324 |
BGaN micro-islands as novel buffers for growth of high-quality GaN on sapphire Akasaka T, Kobayashi Y, Makimoto T |
325 - 327 |
Hexagonal boron nitride on Ni (111) substrate grown by flow-rate modulation epitaxy Kobayashi Y, Nakamura T, Akasaka T, Makimoto T, Matsumoto N |
328 - 331 |
Growth of AIN by vectored flow epitaxy Clayton AJ, Khandekar AA, Kuech TF, Mason NJ, Robinson MF, Watkins S, Guo Y |
332 - 335 |
MOVPE-like HVPE of AlN using solid aluminum trichloride source Eriguchi KI, Murakami H, Panyukova U, Kumagai Y, Ohira S, Koukiu A |
336 - 340 |
Improvement of crystalline quality of N-polar AlN layers on c-plane sapphire by low-pressure flow-modulated MOCVD Takeuchi M, Shimizu H, Kajitani R, Kawasaki K, Kumagai Y, Koukitu A, Aoyagi Y |
341 - 344 |
Influence of growth rate on structural and optical properties of AlInGaN quaternary epilayers Pan YB, Yu TJ, Yang ZJ, Wang H, Qin ZX, Hu XD, Wang K, Yao S, Zhang GY |
345 - 348 |
Improvement of crystal quality of AlN and AlGaN epitaxial layers by controlling the strain with the (AlN/GaN) multi-buffer layer Niikura E, Murakawa K, Hasegawa F, Kawanishi H |
349 - 353 |
Growth of high-quality and crack free AlN layers on sapphire substrate by multi-growth mode modification Okada N, Kato N, Sato S, Sumii T, Nagai T, Fujimoto N, Imura M, Balakrishnan K, Iwaya M, Kamiyama S, Amano H, Akasaki I, Maruyama H, Takagi T, Noro T, Bandoh A |
354 - 356 |
Effect of AlN interlayer on incorporation efficiency of Al composition in AlGaN grown by MOVPE Qin ZX, Luo HJ, Chen ZZ, Yu TJ, Yang ZJ, Xu K, Zhang GY |
357 - 360 |
The template effects on AlN/Al0.3Ga0.7N distributed Bragg reflectors grown by MOCVD Liu B, Zhang R, Xie ZL, Ji XL, Jiang RL, Xiu XQ, Li L, Liu CX, Yu HQ, Han P, Gu SL, Shi Y, Zheng YD |
361 - 366 |
Aluminum incorporation in AlxGa1-xN-layers and implications for growth optimization Rossow U, Fuhrmann D, Litte T, Retzaff T, Hoffmann L, Bremers H, Hangleiter A |
367 - 371 |
Thermodynamic study of AlGaN composition grown by metalorganic chemical vapor deposition Song DW, Kim HJ, Jeon YS, Yoon E |
372 - 374 |
Influence of growth conditions on Al incorporation to AlxGa1-xN (x > 0.4) grown by MOVPE Li DB, Aoki M, Katsuno T, Miyake H, Hiramatsu K, Shibata T |
375 - 378 |
The reactive ion etching characteristics of AlGaN/GaN SLs and etch-induced damage study of n-GaN using Cl-2/SiCl4/Ar plasma Li R, Dai T, Zhu L, Pan HP, Xu K, Zhang B, Yang ZJ, Zhang GY, Gan ZZ, Hu XD |
379 - 382 |
Characterization of AlN : Mn thin film phosphors prepared by metalorganic chemical vapor deposition Sato A, Azumada K, Atsumori T, Hara K |
383 - 386 |
Structural and spectroscopic properties of AlN layers grown by MOVPE Thapa SB, Kirchner C, Scholz F, Prinz GM, Thonke K, Sauer R, Chuvilin A, Biskupek J, Kaiser U, Hofstetter D |
387 - 389 |
Influence of surface atom arrangement on the growth of InN layers on GaAs (111)A and (111)B surfaces by metalorganic vapor-phase epitaxy Murakami H, Torii JI, Kumagai Y, Koukity A |
390 - 393 |
A new photocatalyzer InNxOy film grown by ArF excimer laser-induced MOCVD at low temperature (RT approximate to 200 degrees C) Yamamoto A, Miyanishi M, Kunishige T, Kobayashi T, Hashimoto A, Nambo Y |
394 - 398 |
Electronic band structures and transport properties of wurtzite indium nitride grown by metalorganic vapor phase epitaxy Shen WZ, Jia ZW, Chen J, Ye HB, Ogawa H, Guo QX |
399 - 402 |
Electrical and optical properties of MOVPE InN doped with mg using CP2Mg Yamamoto A, Nagai Y, Niwa H, Miwa H, Hashimoto A |
403 - 408 |
Growth and characterization of InN layers by metal-organic vapour phase epitaxy in a close-coupled showerhead reactor Kadir A, Ganguli T, Gokhale MR, Shah AP, Chandvankar SS, Arora BM, Bhattacharya A |
409 - 412 |
The high mobility InN film grown by MOCVD with GaN buffer layer Xie ZL, Zhang R, Liu B, Li L, Liu CX, Xiu XQ, Zhao H, Han P, Gu SL, Shi Y, Zheng YD |
413 - 417 |
Influence of the reactor inlet configuration on the AlGaN growth efficiency Yakovlev EV, Talalaev RA, Kaluza N, Hardtdegen H, Bay HL |
418 - 424 |
Modeling and process design of III-nitride MOVPE at near-atmospheric pressure in close coupled showerhead and planetary reactors Dauelsberg M, Martin C, Protzmann H, Boyd AR, Thrush EJ, Kappeler J, Heuken M, Talalaev RA, Yakovlev EV, Kondratyev AV |
425 - 427 |
An inverse-flow showerhead MOVPE reactor design Zuo R, Xu Q, Zhang H |
428 - 432 |
GaN materials growth by MOVPE in a new-design reactor using DMHy and NH3 Gautier S, Sartel C, Ould-Saad S, Martin J, Sirenko A, Ougazzaden A |
433 - 436 |
Ex situ dry cleaning of reactor component of nitride metal organic chemical vapor deposition using chlorinated gases Fukuda Y, Orita T, Akutsu N, Ikenaga K, Koseki S, Matsumoto K, Hasaka S |
437 - 440 |
Effects of dopant transport rate upon photoluminescence and electrical properties of ZnTe in atmospheric pressure MOVPE using tris-dimethylaminophosphorus Tanaka T, Nishio M, Hayashida K, Fujimoto K, Guo QX, Ogawa H |
441 - 444 |
Low-pressure metalorganic vapor phase epitaxy growth of ZnTe Kume Y, Guo QX, Tanaka T, Nishio M, Ogawa H, Shen WZ |
445 - 448 |
Growth and characterization of ZnTe epilayers on (100) GaAs substrates by metalorganic vapor phase epitaxy Kume Y, Guo QX, Fukuhara Y, Tanaka T, Nishio M, Ogawa H |
449 - 452 |
Growth characteristics of ZnMgTe layer on ZnTe substrate by metalorganic vapor phase epitaxy Saito K, Yamashita T, Kouno D, Tanaka T, Nishio M, Guo QX, Ogawa H |
453 - 456 |
MOVPE growth, and magnetic and crystallographic studies of Zn1-xVxSe Tahashi M, Goto H, Ido T |
457 - 460 |
Homoepitaxial growth of non-polar ZnO (11(2)over-bar-0) films on off-angle ZnO substrates by MOCVD Abe T, Kashiwaba Y, Onodera S, Masuoka F, Nakagawa A, Endo H, Niikura I, Kashiwaba Y |
461 - 463 |
Growth of epitaxial ZnO thin film on yttria-stabilized zirconia single-crystal substrate Chao YC, Lin CW, Ke DJ, Wu YH, Chen HG, Chang L, Ho YT, Liang MH |
464 - 467 |
Crystal growth of ZnO on Si(111) by metalorganic vapor phase epitaxy Moriyama T, Fujita S |
468 - 471 |
MgxZn1-xO films grown by remote-plasma-enhanced MOCVD with EtCp2Mg Yamamoto K, Enomoto K, Nakamura A, Aoki T, Temmyo J |
472 - 476 |
Atomic layer deposition of epitaxial ZnO on GaN and YSZ Lin CW, Ke DJ, Chao YC, Chang L, Liang MH, Ho YT |
477 - 480 |
Comparison of non-polar ZnO (1 1 (2)over-bar-0) films deposited on single crystal ZnO (1 1 (2)over-bar-0) and sapphire (0 1 (1)over-bar-2) substrates Kashiwaba Y, Abe T, Onodera S, Masuoka F, Nakagawa A, Endo H, Niikura I, Kashiwaba Y |
481 - 485 |
Properties of ZnO epitaxial layers and polycrystalline films prepared by metalorganic molecular beam epitaxial apparatus using diethylzinc and water as precursors Terasako T, Ishiko Y, Saeki K, Yudate S, Shirakata S |
486 - 490 |
P-type nitrogen-doped ZnO thin films on sapphire (1 1 (2)over-bar-0) substrates by remote-plasma-enhanced metalorganic chemical vapor deposition Gangil S, Nakamura A, Ichikawa Y, Yamamoto K, Ishihara J, Aoki T, Temmyo J |
491 - 494 |
Growth of nitrogen-doped ZnO films by MOVPE using diisopropylzinc and tertiary-butanol Kumar OS, Watanabe E, Nakai R, Nishimoto N, Fujita Y |
495 - 499 |
Single-phase Pb(Zn1/3Nb2/3)O-3 thin films grown by metalorganic chemical vapor deposition: Effects of growth sequence and substrates Nishida K, Yokoyama S, Okamoto S, Saito K, Uchida H, Koda S, Katoda T, Funakubo H |
500 - 503 |
Influence of growth interruption and Si doping on the structural and optical properties of AlxGaN/AlN (x > 0.5) multiple quantum wells Li DB, Aoki M, Katsuno T, Miyake H, Hiramatsu K, Shibata T |
504 - 507 |
Optical and micro-structural properties of high photoluminescence efficiency InGaN/AlInGaN quantum well structures Zhu D, Kappers MJ, McAleese C, Graham DM, Chabrol GR, Hylton NP, Dawson P, Thrush EJ, Humphreys CJ |
508 - 510 |
MOVPE growth of InGaN/GaN multiple quantum wells for the blue laser diode applications Cheng AT, Su YK, Lai WC |
511 - 514 |
InGaN multiple quantum wells grown on ELO GaN templates and the optical properties characterization Zhou HL, Chua SJ, Zang KY, Wang LS, Tripathy S, Yakovlev N, Thomas O |
515 - 517 |
Flat-band potentials of GaN and InGaN/GaN QWs by bias-dependent photoluminescence in electrolyte solution Kobayashi N, Morita R, Narumi T, Yamamoto J, Ban Y, Wakao K |
518 - 521 |
Investigation of optical properties of InGaN multiple quantum wells on free-standing GaN substrates grown by metalorganic vapor phase elpitaxy Ohno A, Tomita N, Yamada T, Okagawa H, Takemi M |
522 - 526 |
The influence of internal electric fields on the transition energy of InGaN/gaN quantum well Guo LC, Wang XL, Xiao HL, Wang BZ |
527 - 530 |
Spectroscopic investigations of MOVPE-grown InGaAs/GaAs quantum wells with low and high built-in strain Sharma TK, Singh SD, Porwal S, Nath AK |
531 - 535 |
Photoluminescence and photoluminescence-excitation spectroscopy of InGaPN/GaP lattice-matched single quantum well structures grown by MOVPE Kaewket D, Tungasmita S, Sanorpim S, Nakajima F, Nakadan N, Kimura T, Katayama R, Onabe K |
536 - 539 |
Comparison of H-2 and N-2 as carrier gas in MOVPE growth of InGaAsN quantum wells Reentila O, Mattila M, Knuuttila L, Hakkarainen T, Soparlen M, Lipsanen H |
540 - 543 |
Optical characterization of improvement of carrier localization in InGaAsN/GaAs single quantum wells by addition of Sb flux to interfaces Iguchi Y, Ishizuka T, Yamada T, Takagishi S, Nomura K, Nakayama M |
544 - 547 |
MOVPE and characterization of InAsN/GaAs multiple quantum wells Kuboya S, Thieu QT, Ono W, Nakajima F, Katayama R, Onabe K |
548 - 552 |
Effect of antimony on the density of InAs/Sb : GaAs(100) quantum dots grown by metalorganic chemical-vapor deposition Guimard D, Nishioka M, Tsukamoto S, Arakawa Y |
553 - 557 |
Stacking, polarization control, and lasing (1.55 mu m region) InAs/InGaAsP/InP (100) quantum dots Anantathanasarn S, Notzel R, van Veldhoven PJ, van Otten FWM, Eijkemans TJ, Barbarin Y, de Vries T, Smalbrugge E, Geluk EJ, Bente E, Oei YS, Smit MK, Wolter JH |
558 - 561 |
Controlling shape of InAs1-xSbx quantum structures on InP for quantum dots with 1.55-mu m emission Kawaguchi K, Ekawa M, Akiyama T, Kuwatsuka H, Sugawara M |
562 - 566 |
Growth temperature and InAs supply dependences of InAs quantum dots on InP (001) substrate Okawa T, Yamauchi Y, Yamamoto J, Yoshida J, Shimomura K |
567 - 569 |
Epitaxy of multimodal InAs/GaAs quantum dot ensembles Potschke K, Feise D, Pohl UW, Bimberg D |
570 - 573 |
Lateral-shape of InAs/GaAs quantum dots in vertically correlated structures Hospodkova A, Krapek V, Mates T, Kuldova K, Pangrac J, Hulicius E, Oswald J, Melichar K, Humlicek J, Simecek T |
574 - 577 |
Wavelength elongation and improved emission efficiency of MOCVD-grown InAs quantum dots by GaNAs buffer layer Suzuki R, Miyamoto T, Koyama F |
578 - 581 |
Controlling emission wavelength of double-capped InAs quantum dots by selective MOVPE employing stripe mask array Yamauchi Y, Okamoto S, Okawa T, Kawakita Y, Yoshida J, Shimomura K |
582 - 585 |
Properties of MOVPE InAs/GaAs quantum dots overgrown by InGaAs Hospodkova A, Hulicius E, Oswald J, Pangrac J, Mates T, Kuldova K, Melichar K, Simecek T |
586 - 590 |
Tuning and understanding the emission characteristics of MOVPE-grown self-assembled InAs/InP quantum dots Bansal B, Gokhale MR, Bhattacharya A, Arora BM |
591 - 594 |
MOCVD of InGaAs/GaAs quantum dots for lasers emitting close to 1.3 mu m Germann TD, Strittmatter A, Kettler T, Posilovic K, Pohl UW, Bimberg D |
595 - 598 |
Red to green photoluminescence of InP-quantum dots in AlxGa1-xInP Rossbach R, Schulz WM, Reischle M, Beirne GJ, Jetter M, Michler P |
599 - 602 |
Green photoluminescence of single InP-quantum dots grown on Al0.66Ga0.33InP/AlInP distributed Bragg reflectors Rossbach R, Schulz WM, Jetter M, Michler P |
603 - 606 |
Vertical asymmetric double quantum dots Rossbach R, Reischle M, Beirne GJ, Schweizer H, Jetter M, Michler P |
607 - 611 |
Growth and characterisation of GaAs/InGaAs/GaAs nanowhiskers on (111) GaAs Regolin I, Sudfeld D, Luttjohann S, Khorenko V, Prost W, Kastner J, Dumpich G, Meier C, Lorke A, Tegude FJ |
612 - 615 |
Self-assembled formation of ferromagnetic MnAs nanoclusters on GaInAs/InP (111) B layers by metal-organic vapor phase epitaxy Hara S, Motohisa J, Fukui T |
616 - 619 |
Mechanism of catalyst-free growth of GaAs nanowires by selective area MOVPE Ikejiri K, Noborisaka J, Hara S, Motohisa J, Fukui T |
620 - 624 |
GaAs nanowires grown by Au-catalyst-assisted MOVPE using tertiarybutylarsine as group-V precursor Paiano P, Prete P, Speiser E, Lovergine N, Richter W, Tapfer L, Mancini AM |
625 - 630 |
MOVPE growth and real structure of vertical-aligned GaAs nanowires Bauer J, Gottschalch V, Paetzelt H, Wagner G, Fuhrmann B, Leipner HS |
631 - 634 |
InAs nanowires grown by MOVPE Dick KA, Deppert K, Samuelson L, Seifert W |
635 - 639 |
The structure of < 1 1 1 > B oriented GaP nanowires Johansson J, Karlsson LS, Svensson CPT, Martensson T, Wacaser BA, Deppert K, Samuelson L |
640 - 643 |
Catalyst-free fabrication of InP and InP(N) nanowires by metalorganic vapor phase epitaxy Mattila M, Hakkarainen T, Lipsanen H |
644 - 647 |
Growth of highly uniform InAs nanowire arrays by selective-area MOVPE Tomioka K, Mohan P, Noborisaka J, Hara S, Motohisa J, Fukui T |
648 - 651 |
A(III)-B-V nano- and microtubes fabricated on (110)-oriented GaAs- and GaP-substrate using the metal-organic vapor-phase epitaxy Paetzelt H, Gottschalch V, Bauer J, Wagner G |
652 - 657 |
MOVPE growth optimization for laser diodes with highly strained InGaAs MQWs Bugge F, Zeimer U, Staske R, Sumpf B, Erbert G, Weyers M |
658 - 662 |
Evaluation of incorporation efficiency of group V source gases in metal organic chemical vapor deposition of GaInNAs for high quality 1.21 mu m quantum-well ridge wave guide lasers Kushibe M, Hashimoto R, Ezaki M, Hatakoshi GI, Nishioka M, Arakawa Y |
663 - 666 |
Low threshold InP/AlGaInP on GaAs QD laser emitting at similar to 740 nm Krysa AB, Liew SL, Lin JC, Roberts JS, Lutti J, Lewis GM, Smowton PM |
667 - 671 |
High-power red laser diodes grown by MOVPE Zorn M, Wenzel H, Zeimer U, Sumpf B, Erbert G, Weyers M |
672 - 675 |
Selective-area MOVPE growth for 10 Gbit/s electroabsorption modulator integrated with a tunable DBR laser Kim SB, Sim JS, Kim KS, Sim ED, Ryu SW, Park HL |
676 - 681 |
Simple estimation of strain distribution in narrow-stripe waveguide array fabricated by selective MOVPE Yoshioka T, Kawakita Y, Kawai A, Okawa T, Shimomura K |
682 - 686 |
Low current operation of GaN-based blue-violet laser diodes fabricated on sapphire substrate using high-temperature-grown single-crystal AlN buffer layer Ohba Y, Gotoda T, Kaneko K |
687 - 690 |
GaN/AlGaN active regions for terahertz quantum cascade lasers grown by low-pressure metal organic vapor deposition Huang GS, Lu TC, Yao HH, Kuo HC, Wang SC, Sun G, Lin CW, Chang L, Soref RA |
691 - 694 |
High reflectivity AlGaN/AlN DBR mirrors grown by MOCVD Xie ZL, Zhang R, Liu B, Ji XL, Li L, Liu CX, Jiang RL, Gong HM, Zhao H, Han P, Shi Y, Zheng YD |
695 - 698 |
Micro-crack-free high power blue-violet GaN-based laser diodes grown on maskless epitaxial lateral overgrown GaN/sapphire Lee SN, Paek HS, Ryu HY, Son JK, Sakong T, Jang T, Choi KK, Sung YJ, Kim YH, Kim HK, Chae SH, Ha KH, Chae JH, Kim KS, Kwak JS, Nam OH, Park Y |
699 - 702 |
Structural and optical properties of near-UV LEDs grown on V-grooved sapphire substrates fabricated by wet etching Cheong HS, Na MG, Choi YJ, Cuong TV, Hong CH, Suh EK, Kong BH, Cho HK |
703 - 705 |
Studies of improving light extraction efficiency of high power blue light-emitting diode by photo-enhanced chemical etching Fang H, Kang XN, Hu CY, Dai T, Chen ZZ, Qin ZX, Zhang B, Zhang GY |
706 - 709 |
Semipolar GaN/GaInN LEDs with more than 1 mW optical output power Neubert B, Wunderer T, Bruckner P, Scholz F, Feneberg M, Lipski F, Schirra M, Thonke K |
710 - 713 |
Increased power from deep ultraviolet LEDs via precursor selection Moe C, Onuma T, Vampola K, Fellows N, Masui H, Newman S, Keller S, Chichibu SF, DenBaars SP, Emerson D |
714 - 718 |
The effect of high temperature on the optical properties of InGaN/GaN blue light-emitting diodes with multiquantum barriers Nee TE, Wang JC, Shen HT, Wu YF |
719 - 721 |
Influences of laser lift-off process on the performances of large-area light-emitting diodes Hu CY, Kang XN, Fang H, Dai T, Wang MJ, Qin ZX, Chen ZZ, Yang H, Shen B, Zhang GY |
722 - 724 |
High brightness GaN vertical light emitting diodes on metal alloyed substrate for general lighting application Tran CA, Chu CF, Cheng CC, Liu WH, Chu JY, Cheng HC, Fan FH, Yen JK, Doan T |
725 - 730 |
High-performance III-nitride blue LEDs grown and fabricated on patterned Si substrates Zhang BS, Liang H, Wang Y, Feng ZH, Ng KW, Lau KM |
731 - 735 |
The origins of double emission peaks in electroluminescence spectrum from InGaN/GaN MQW LED Chen ZZ, Liu P, Qi SL, Xu K, Qin ZX, Tong YZ, Yu TJ, Hu XD, Zhang GY |
736 - 739 |
Integrated light-emitting diodes grown by MOVPE for flat panel displays Honda T, Kobayashi T, Egawa S, Sawada M, Sugimoto K, Baba T |
740 - 743 |
The effect of InGaN/GaN MQW hydrogen treatment and threading dislocation optimization on GaN LED efficiency Suihkonen S, Svensk O, Lang T, Lipsanen H, Odnoblyudov MA, Bougrov VE |
744 - 747 |
GaNUV photodetector by using transparency antimony-doped tin oxide electrode Tu ML, Su YK, Chang SJ, Chuang RW |
748 - 753 |
Using MOVPE growth to generate tomorrow's solar electricity Kurtz S, Friedman D, Geisz J, McMahon W |
754 - 757 |
Strain-balanced MQW pin solar cells grown using a robot-loading showerhead reactor Roberts JS, Airey R, Hill G, Calder C, Barnham KWJ, Lynch M, Tibbits T, Johnson D, Pakes A, Grantham T |
758 - 761 |
Study of intrinsically carbon-doped AlGaAs layers for tunnel diodes in multi-junction solar cells Mols Y, Leys MR, Simons E, Poortmans J, Borghs G |
762 - 766 |
Improvements in the MOVPE growth of multi-junction solar cells for very high concentration Rey-Stolle I, Garcia I, Galiana B, Algora C |
767 - 771 |
Research of surface morphology in Ga(In)As epilayers on Ge grown by MOVPE for multi-junction solar cells Wu PH, Su YK, Chen IL, Chen SF, Chiou CH, Guo SH, Hsu JT, Chen WR |
772 - 776 |
On the development of high-efficiency thin-film GaAs and GaInp(2) cells van Deelen J, Bauhuis GJ, Schermer JJ, Mulder P, Haverkamp EJ, Larsen PK |
777 - 781 |
Growth of an InGaAs/GaAsSb tunnel junction for an InP-based low band gap tandem solar cell Seidel U, Schimper HJ, Kollonitsch Z, Moller K, Schwarzburg K, Hannappel T |
782 - 786 |
Photovoltaic properties of multilayer organic thin films Inoue J, Yamagishi K, Yamashita M |
787 - 790 |
Minority carrier diffusion lengths in MOVPE-grown n- and p-InGaN and performance of AlGaN/InGaN/GaN double heterojunction bipolar transistors Kumakura K, Makimoto T, Kobayashi N, Hashizume T, Fukui T, Hasegawa H |
791 - 793 |
MOCVD-grown high-mobility Al0.3Ga0.7N/AlN/GaN HEMT structure on sapphire substrate Wang XL, Wang CM, Hu GX, Mao HL, Fang CB, Wang JX, Ran JX, Li HP, Li JM, Wang ZG |
794 - 799 |
Analysis of tellurium as n-type dopant in GaInP: Doping, diffusion, memory effect and surfactant properties Garcia I, Rey-Stolle I, Galiana B, Algora C |
800 - 803 |
Investigation of optical quenching of photoconductivity in high-resistivity GaN epilayer Fang CB, Wang XL, Xiao HL, Hu GX, Wang CM, Wang XY, Li JP, Wang JX, Li CJ, Zeng YP, Li JM, Wang ZG |
804 - 807 |
Investigation on the different barrier effect of Ni and Pt in the Ti/Al/Pt/Au and Ti/Al/Ni/Au contacts to n-type GaN Hu CY, Ding ZB, Qin ZX, Chen ZZ, Xu K, Wang YJ, Yang ZJ, Yao SD, Shen B, Zhang GY |
808 - 810 |
Ohmic contact mechanism of Ni/Au contact to p-type GaN studied by Rutherford backscattering spectrometry Hu CY, Ding ZB, Qin ZX, Chen ZZ, Xu K, Yang ZJ, Shen B, Yao SD, Zhang GY |
811 - 814 |
Effect of growth conditions on electrical properties of Mg-doped p-GaN Svensk O, Suihkonen S, Lang T, Lipsanen H, Sopanen M, Odnoblyudov MA, Bougrov VE |
815 - 818 |
Vertical conductivity of p-AlxGa1-xN/GaN superlattices measured with modified transmission line model Hu CY, Wang YJ, Xu K, Hu XD, Yu LS, Yang ZJ, Shen B, Zhang GY |
819 - 821 |
Low-resistance graded AlxGa1-xN buffer layers for vertical conducting devices on n-SiC substrates Nishikawa A, Kumakura K, Akasaka T, Makimoto T |
822 - 825 |
AlGaN/GaN HEMT grown on large size silicon substrates by MOVPE capped with in-situ deposited Si3N4 Cheng K, Leys M, Derluyn J, Degroote S, Xiao DP, Lorenz A, Boeykens S, Germain M, Borghs G |
826 - 830 |
In situ epitaxial surface passivation of GaAlN/GaN HEMT heterostructures grown by LP-MOCVD Poisson MADF, Sarazin N, Magis M, Tordjman M, Morvan E, Aubry R, di Persio J, Grimbert B |
831 - 834 |
C-doped GaN buffer layers with high breakdown voltages for high-power operation AlGaN/GaN HFETs on 4-in Si substrates by MOVPE Kato S, Satoh Y, Sasaki H, Masayuki I, Yoshida S |
835 - 839 |
AlGaN/AlN/GaN/SiC HEMT structure with high mobility GaN thin layer as channel grown by MOCVD Wang XL, Hu GX, Ma ZY, Ran JX, Wang CM, Mao HL, Tang H, Li HP, Wang JX, Zeng YP, Jinmin LM, Wang ZG |
840 - 842 |
High-resolution X-ray diffraction study of laser lift-off AlGaN/GaN HEMTs grown by MOCVD method Leung KK, Chan CP, Fong WK, Pilkuhn M, Schweizer H, Surya C |
843 - 847 |
MOVPE, processing and characterization of AlGaN/GaN HEMTs with different Al concentrations on silicon substrates Fieger M, Eickelkamp M, Koshroo LR, Dikme Y, Noculak A, Kalisch H, Heuken M, Jansen RH, Vescan A |
848 - 851 |
DC characteristics improvement of recessed gate GaN-based HFETs grown by MOCVD Cheng AT, Su YK, Lai WC, Huang CH |
852 - 856 |
High current gain graded GaN/InGaN heterojunction bipolar transistors grown on sapphire and SiC substrates by metalorganic chemical vapor deposition Chung T, Keogh DM, Ryou JH, Yoo D, Limb J, Lee W, Shen SC, Asbeck PM, Dupuis RD |
857 - 860 |
High current gain stability of carbon-doped p-GaAs in InGaP/GaAs heterojunction bipolar transistors Yamada H, Fukuhara N, Hata M |
861 - 866 |
Correlation between the base-emitter interface crystalline quality and the current gain in InGaP/GaAs HBTs grown by MOVPE Uchida K, Kurokawa A, Yang FY, Jin Z, Nozaki S, Morisaki H |
867 - 870 |
InP buried growth of SiO2 wires toward reduction of collector capacitance in HBT Miyamoto Y, Ishida M, Yamamoto T, Miura T, Furuya K |
871 - 874 |
High-purity GaN epitaxial layers for power devices on low-dislocation-density GaN substrates Hashimoto S, Yoshizumi Y, Tanabe T, Kiyama M |
875 - 878 |
High-breakdown-voltage pn-junction diodes on GaN substrates Yoshizumi Y, Hashimoto S, Tanabe T, Kiyama M |