391 - 394 |
Reactivity of Lithium Intercalated into Petroleum Coke in Carbonate Electrolytes Jean M, Tranchant A, Messina R |
394 - 400 |
Nanocrystalline TiO2 (Anatase) Electrodes - Surface-Morphology, Adsorption, and Electrochemical Properties Kavan L, Gratzel M, Rathousky J, Zukal A |
401 - 405 |
Voltammetry and Conductivity of a Polyether-Pyridinium Room-Temperature Molten-Salt Electrolyte and of Its Polymer Electrolyte-Solutions in Polydimethylsiloxane Pyati R, Murray RW |
406 - 412 |
Sodium/Phosphorus-Sulfur Cells .1. Cell Performance Ridgway PL, Mclarnon FR, Cairns EJ |
412 - 417 |
Sodium/Phosphorus-Sulfur Cells .2. Phase-Equilibria Ridgway PL, Mclarnon FR, Cairns EJ |
418 - 422 |
The Effect of Mechanical Processing Procedures on the Decomposition Rate of Silver-Oxide Cathode Material Takeda K |
422 - 428 |
The Reaction of Clean Li Surfaces with Small Molecules in Ultrahigh-Vacuum .1. Dioxygen Wang KL, Ross PN, Kong FP, Mclarnon F |
429 - 435 |
Studies of Electrochemical Properties of Ti0.35Zr0.65Nixv2-X-Ymny Alloys with C-14 Laves Phase for Nickel/Metal Hydride Batteries Yang HW, Wang YY, Wan CC |
435 - 441 |
Application of Porous-Electrode Theory on Metal Hydride Electrodes in Alkaline-Solution Zheng G, Popov BN, White RE |
442 - 448 |
Corrosion of Tin Oxide at Anodic Potentials Cachet H, Froment M, Zenia F |
449 - 458 |
The Detection and Analysis of Electrochemical Damage in Bismaleimide/Graphite Fiber Composites Taylor SR, Wall FD, Cahen GL |
458 - 465 |
Anodic Behavior of Copper in Iodide Solutions - Comparison with Chloride and Effect of Benzotriazole-Type Inhibitors Tromans D, Silva JC |
466 - 471 |
Kinetics of Particle Coarsening at Gold Electrode/Electrolyte Solution Interfaces Followed by in-Situ Scanning-Tunneling-Microscopy Andreasen G, Nazzarro M, Ramirez J, Salvarezza RC, Arvia AJ |
472 - 480 |
Plasma Treatment Process for Palladium Chemisorption Onto Polymers Before Electroless Deposition Charbonnier M, Alami M, Romand M |
480 - 485 |
3-Dimensional Calculation of Current Distribution in Electrodeposition on Patterned Cathode with Auxiliary Electrode Choi YS, Kang T |
486 - 492 |
Workpiece, Pattern, and Feature Scale Current Distributions Debecker B, West AC |
493 - 498 |
Improved Selenization Procedure to Obtain CuInSe2 Thin-Films from Sequentially Electrodeposited Precursors Guillen C, Herrero J |
498 - 505 |
Effect of the Composition of Polypyrrole Substrate on the Electrodeposition of Copper and Nickel Hepel M, Chen YM, Stephenson R |
505 - 509 |
Mathematical-Modeling of Electroless Nickel Deposition at Steady-State Using Rotating-Disk Electrode Kim YS, Sohn HJ |
510 - 516 |
Kinetics and Mechanism of Electroless Deposition of Copper Mishra KG, Paramguru RK |
517 - 523 |
Effects of Postdeposition Heat-Treatment on Morphology and Microstructure of CdTe Grown by Electrodeposition Qi B, Kim DW, Williamson DL, Trefny JU |
524 - 530 |
Oxidation of N-InP and Indium in the Negative Potential Region at pH-5 Quinlan KP, Yip PW, Rai AK, Wittberg TN |
530 - 543 |
Microstructure-Property Relations of Solid Oxide Fuel-Cell Cathodes and Current Collectors - Cathodic Polarization and Ohmic Resistance Sasaki K, Wurth JP, Gschwend R, Godickemeier M, Gauckler LJ |
544 - 549 |
Effect of Mask Wall Angle on Shape Evolution During Through-Mask Electrochemical Micromachining Shenoy RV, Datta M |
550 - 556 |
Electroreduction of C-60 in Aprotic-Solvents .3. Voltammetric Study, at Microelectrode, of C-60(N-) (N=0 to 4) Solvation in the Absence of Supporting Electrolyte Soucazeguillous B, Kutner W, Jones MT, Kadish KM |
556 - 560 |
The Anodic Behavior of Azide Ions at Carbon Electrodes in Neutral Electrolyte Dalmia A, Wasmus S, Savinell RF, Liu CC |
561 - 566 |
Electrochemical-Behavior of the Manganese-Substituted Nickel Hydroxides Guerloudemourgues L, Delmas C |
567 - 570 |
Nonstoichiometry of Sintered Oxide Ca0.9La0.1Mno3-Delta and Its Cathodic Properties in Alkaline-Solutions Morimoto H, Kamata M, Esaka T |
570 - 574 |
A Temperature Study of the Ionic-Conductivity of a Hybrid Polymer Electrolyte Olsen II, Koksbang R |
574 - 582 |
In-Situ X-Ray-Absorption Near-Edge Spectroscopic Study of the Cathodic Reduction of Artificial Iron-Oxide Passive Films Schmuki P, Virtanen S, Davenport AJ, Vitus CM |
582 - 586 |
Pulsed Electroreduction of CO2 on Silver Electrodes Shiratsuchi R, Nagami G |
587 - 599 |
Characterization of Polymer Electrolyte Fuel-Cells Using AC-Impedance Spectroscopy Springer TE, Zawodzinski TA, Wilson MS, Gottesfeld S |
600 - 608 |
Modeling Lithium Intercalation of Single-Fiber Carbon Microelectrodes Verbrugge MW, Koch BJ |
609 - 613 |
Construction and Working Mechanism of Sulfur-Dioxide Sensor Utilizing Stabilized Zirconia and Metal Sulfate Yan Y, Miura N, Yamazoe N |
614 - 619 |
An X-Ray-Absorption Near-Edge Spectroscopic Study of the Structure of Passive Films on Amorphous Al-Fe-Ce Alloys Mansour AN, Melendres CA, Poon SJ, He Y, Shiflet GJ |
619 - 623 |
Kinetics and Modeling of Wet Etching of Aluminum-Oxide by Warm Phosphoric-Acid Zhou B, Ramirez WF |
624 - 627 |
Growth and Resistivity Behavior of Copper Film by Chemical-Vapor-Deposition Choi ES, Park SK, Lee HH |
628 - 633 |
Repair of Plasma Etch Related Gate Perimeter Damage Using Low-Temperature Oxidation Guldi RL, Wyke DR |
634 - 639 |
On the Mechanism of Boron Incorporation During Silicon Epitaxy by Means of Chemical-Vapor-Deposition Kuhne H, Fischer A, Ozturk MC, Sanganeria MK |
639 - 642 |
Nano-Trenched Local Oxidation of Silicon Isolation Using Island Polysilicon Grains Kwon SK, Lim C, Cho BJ, Kim JC |
643 - 648 |
Wettability of Polished Silicon-Oxide Surfaces Thomas RR, Kaufman FB, Kirleis JT, Belsky RA |
649 - 657 |
Silicon Nucleation and Film Evolution on Silicon Dioxide Using Disilane - Rapid Thermal Chemical-Vapor-Deposition of Very Smooth Silicon at High Deposition Rates Violette KE, Ozturk MC, Christensen KN, Maher DM |
657 - 665 |
Self-Developing Characteristics of Si Containing Polymers and Their Application to X-Ray-Lithography Yamaguchi A, Ogawa T, Tachibana H, Oizumi H, Soga T, Matsumoto M, Matsuzaka T, Takeda E |
666 - 671 |
Microcrystal Growth on Borophosphosilicate Glass-Film During High-Temperature Annealing Yoshimaru M, Wakamatsu H |
672 - 676 |
Etching Profiles and Neutral Shadowing in Long Trenches Abrahamshrauner B, Wang CD |
677 - 682 |
Effect of Transport Phenomena on Boron Concentration Profiles in Silicon Epitaxial Wafers Habuka H, Mayusumi M, Tsunoda H, Katayama M |
683 - 687 |
Deposition of Tin Oxide into Porous Silicon by Atomic Layer Epitaxy Ducso C, Khanh NQ, Horvath Z, Barsony I, Utriainen M, Lehto S, Nieminen M, Niinisto L |
687 - 691 |
Phase-Transformation and Lattice Strain of Alpha-AgI Stabilized in Superionic Glass Saito T, Tatsumisago M, Minami T |
691 - 695 |
Selective Electroless Nickel Deposition on Patterned Phosphonate and Carboxylate Polymer-Films Schilling ML, Katz HE, Houlihan FM, Stein SM, Hutton RS, Taylor GN |
695 - 700 |
Confinement Phenomena in Buried Oxides of Simox Structures as Affected by Processing Afanasev VV, Revesz AG, Hughes HL |
701 - 707 |
Plasma-Assisted Dry-Etching of Cobalt Silicide for Microelectronics Applications Fracassi F, Dagostino R, Lamendola R, Filippo A, Rapisarda C, Vasquez P |
707 - 711 |
Characteristics of Siof Films Formed Using Tetraethylorthosilicate and Fluorotriethoxysilane at Room-Temperature by Chemical-Vapor-Deposition Homma T |
712 - 716 |
Control of Surface Concentration of Boron or Phosphorus Employing Ion Shower Doping Kasamatsu A, Takakubo H, Shono K |
716 - 721 |
Modeling of the Wear Mechanism During Chemical-Mechanical Polishing Liu CW, Dai BT, Tseng WT, Yeh CF |
722 - 725 |
Asymmetric Distribution of Oxygen Concentration in the Si Melt of a Czochralski System Yi KW, Kakimoto K, Niu ZG, Eguchi M, Noguchi H, Nakamura S, Mukai K |
725 - 735 |
Microstructural Properties of Helium Implanted Void Layers in Silicon as Related to Front-Side Gettering Medernach JW, Hill TA, Myers SM, Headley TJ |
736 - 744 |
Atmospheric-Pressure Chemical-Vapor-Deposition of Titanium Nitride from Tetrakis (Diethylamido) Titanium and Ammonia Musher JN, Gordon RG |
744 - 749 |
A 0.25 Mu-M MOSFET Technology Using in-Situ Rapid Thermal Gate Dielectrics Zhang KX, Osburn CM, Hames G, Parker C, Bayoumi A |
749 - 751 |
Dissolution Windows for Wet Chemical-Processing of Silicon and Silicon Dioxide - Potential-pH Diagrams for the Si-F-H2O System Osseoasare K, Wei DW, Mishra KK |
752 - 758 |
Comparison of Dry-Etching Techniques for III-V Semiconductors in CH4/H-2/Ar Plasmas Pearton SJ, Lee JW, Lambers ES, Abernathy CR, Ren F, Hobson WS, Shul RJ |
L21 - L23 |
In-Situ FTIR-Diffuse Reflection Spectroscopy of the Anode Surface in a Direct Methanol/Oxygen Fuel-Cell Fan QB, Pu C, Lay KL, Smotkin ES |
L24 - L25 |
Promoting Effect of Sodium Dodecyl-Sulfate on the Redox Reaction of Hemoglobin Li GX, Fang HQ, Liao XM, Shi HR, Chen HY |
L26 - L28 |
Effects of the Organic-Solvent on the Electrochemical Lithium Intercalation Behavior of Graphite Electrode Morita M, Ichimura T, Ishikawa M, Matsuda Y |
L29 - L30 |
A New-Type of a Rocking-Chair Battery Family Based on a Graphite Anode and a Polymer Cathode Panero S, Spila E, Scrosati B |
L31 - L33 |
The Role of Microcracking in Zrcrni Hydride Electrodes Mccormack M, Badding ME, Vyas B, Zahurak SM, Murphy DW |
L33 - L35 |
Mixed Potential Type NOx Sensor-Based on Stabilized Zirconia and Oxide Electrode Miura N, Lu GY, Yamazoe N, Kurosawa H, Hasei M |
L36 - L37 |
Selective Co Detection by Using Indium Oxide-Based Semiconductor Gas Sensor Yamaura H, Tamaki J, Moriya K, Miura N, Yamazoe N |
L38 - L40 |
Control of Selective Tungsten Chemical-Vapor-Deposition by Monolayer Nitridation of Silicon Surface Takami S, Saito T, Fujii M, Egashira Y, Komiyama H |
L40 - L42 |
Bevel Etching of Tin-Doped Indium Oxide Vandenmeerakker JE, Jacobs JW |
L42 - L44 |
Fabrication of a Porous Silicon Diode Possessing Distinct Red and Orange Electroluminescent Regions Zhang LB, Coffer JL, Rho YG, Pinizzotto RF |
L44 - L47 |
A Novel Electrochemical Method for Measuring Salt Diffusion-Coefficients and Ion Transference Numbers Xu J, Farrington GC |