797 - 801 |
Characterization of magnetron-sputtered partially ionized deposition as a function of metal and gas species Allain MMC, Hayden DB, Juliano DR, Ruzic DN |
802 - 808 |
Microstructural and morphological analysis of ultrathin YBa2Cu3O7-x films grown by modulated magnetron sputtering on SrTiO3 substrates Del Vecchio A, De Riccardis MF, Tapfer L, Camerlingo C, Russo M |
809 - 813 |
Diagnostics by optical absorption of sputtered atom density in magnetron discharges Dony MF, Dauchot JP, Wautelet M, Hecq M, Ricard A |
814 - 818 |
Influence of substrate temperature on the properties of indium oxide thin films Adurodija FO, Izumi H, Ishihara T, Yoshioka H, Motoyama M, Murai K |
819 - 822 |
Epitaxial growth structure and physical properties of Fe film biased dc-plasma sputter deposited on MgO(001) Chen CC, Yang JP, Nakai H, Hashimoto M |
823 - 829 |
Optimization of plasma density and radial uniformity of a point-cusp magnetic field applied capacitive plasma Wickramanayaka S, Nakagawa Y, Sago Y, Numasawa Y |
830 - 834 |
Depth distribution of plasma induced damage and dislocation generation due to an interaction of subsequent oxidation Yamaguchi T, Sasaki T, Nikoh H, Ito T |
835 - 839 |
Platinum etching using a TiO2 hard mask in an O-2/Cl-2/Ar plasma Chung CW, Chung I |
840 - 848 |
Large-diameter microwave plasma source excited by azimuthally symmetric surface waves Tuda M, Ono K, Ootera H, Tsuchihashi M, Hanazaki M, Komemura T |
849 - 859 |
Diagnostic studies of aluminum etching in an inductively coupled plasma system: Determination of electron temperatures and connections to plasma-induced damage Malyshev MV, Donnelly VM, Downey SW, Colonell JI, Layadi N |
860 - 863 |
Simulation of the influence of the filament arrangement on the gas phase during hot filament chemical vapor deposition of diamond films Song GH, Sun C, Huang RF, Wen LS |
864 - 872 |
Diagnostics of an inductively coupled CF4/Ar plasma Hioki K, Hirata H, Matsumura S, Petrovic ZL, Makabe T |
873 - 878 |
Study of the effects of discharge conditions and substrate temperature on Si epitaxial deposition using sputtering-type electron cyclotron resonance plasma Gao JS, Wang JL, Sakai N, Iwanaga K, Muraoka K, Nakashima H, Gao DW, Furukawa K |
879 - 881 |
Selective etching of GaN over AlN using an inductively coupled plasma and an O-2/Cl-2/Ar chemistry Smith SA, Lampert WV, Rajagopal P, Banks AD, Thomson D, Davis RF |
882 - 890 |
Mass-resolved ion energy distributions in continuous dual mode microwave/radio frequency plasmas in argon and nitrogen Hallil A, Zabeida O, Wertheimer MR, Martinu L |
891 - 899 |
Kinetic study of 3C-SiC growth on Si by pyrolyzing tetramethysilane in low pressure radio frequency-induction heated chemical vapor deposition reactor Kim KC, Nahm KS, Hahn YB, Lee YS, Byun HS |
900 - 906 |
Adhesion improvement of cubic BN : C film synthesized by a helicon wave plasma chemical vapor deposition process Kim KB, Kim SH |
907 - 916 |
Monte Carlo simulation of vapor transport in physical vapor deposition of titanium Balakrishnan J, Boyd ID, Braun DG |
917 - 921 |
Titanium oxide films on Si(100) deposited by electron-beam evaporation at 250 degrees C Jang HK, Whangbo SW, Kim HB, Im KY, Lee YS, Lyo IW, Whang CN, Kim G, Lee HS, Lee JM |
922 - 926 |
Nonisomorphic ErF3 layers on Si(111) substrates grown by molecular beam epitaxy Ko JM, Durbin SD, Fukuda T, Inaba K |
927 - 932 |
Plasma erosion of a magnesium radio-frequency cathode measured by laser-induced fluorescence Brockhaus A, Georg A, Wingsch V, Engemann J |
933 - 937 |
Design and preparation of a 33-layer optical reflection filter of TiO2-SiO2 system Wang XR, Masumoto H, Someno Y, Chen LD, Hirai T |
938 - 945 |
New C-F interatomic potential for molecular dynamics simulation of fluorocarbon film formation Tanaka J, Abrams CF, Graves DB |
946 - 950 |
Synergism of transmission measurements with spectroscopic ellipsometry measurements in the analysis of a nearly opaque bimetal film stack on glass Tompkins HG, Tasic S |
951 - 955 |
Atomic hydrogen-cleaned GaAs(100) negative electron affinity photocathode: Surface studies with reflection high-energy electron diffraction and quantum efficiency Elamrawi KA, Hafez MA, Elsayed-Ali HE |
956 - 959 |
Excitons in ultrathin InAs/InP quantum wells: Interplay between extended and localized states Paki P, Leonelli R, Isnard L, Masut RA |
960 - 964 |
Surface diffusion of adsorbed Si atoms on the Si(111)7x7 surface studied by atom-tracking scanning tunneling microscopy Sato T, Kitamura S, Iwatsuki M |
965 - 967 |
Residual stress in GaN epilayers grown on silicon substrates Fu YK, Gulino DA, Higgins R |
968 - 971 |
Wide range temperature dependence of reflection high-energy electron diffraction rocking curve from a Si(111)7x7 surface Fukaya Y, Nakamura K, Shigeta Y |
972 - 979 |
Influence of air exposures and thermal treatments on the secondary electron yield of copper Bojko I, Hilleret N, Scheuerlein C |
980 - 991 |
Stress, microstructure, and stability of Mo/Si, W/Si, and Mo/C multilayer films Windt DL |
992 - 994 |
Delivery of pure ozone in ultrahigh vacuum Zhukov V, Popova I, Yates JT |
995 - 1001 |
Novel method for absolute quantification of the flux and angular distribution of a radical source for atomic hydrogen Schwarz-Selinger T, von Keudell A, Jacob W |
1002 - 1005 |
Low noise bipolar complementary metal-oxide-semiconductor mixer for radio frequency applications Colomines S, Parra T, Graffeuil J, Plana R |
1006 - 1009 |
Modeling and characterization of logarithmic complementary metal-oxide-semiconductor active pixel sensors Tabet M, Tu N, Hornsey R |
1010 - 1015 |
Real time scanning tunneling microscopy study of the initial stages of oxidation of Ni(111) between 400 and 470 K Hildebrandt S, Hagendorf C, Doege T, Jeckstiess C, Kulla R, Neddermeyer H, Uttich T |
1016 - 1024 |
Designs, analyses, and tests of a spiral-grooved turbobooster pump Jou RY, Cheng HP, Chang YW, Chen FZ, Iwane M |
1025 - 1034 |
Molecular transition and slip flows in the pumping channels of drag pumps Heo JS, Hwang YK |
1035 - 1037 |
Evacuating flat glass panels Collins RE, Lenzen M, Ng N |
1038 - 1040 |
Microhardness and structural analysis of (TI,AI)N, (Ti,Cr)N, (Ti,Zr)N and (TI,V)N films Hasegawa H, Kimura A, Suzuki T |
1041 - 1044 |
Patterning of polycrystalline diamond thin films on a variety of substrates by selectively seeding with purified ultrafine diamond powder Liu HW, Gao CX, Li X, Wang CX, Han YH, Zou GT, Wang WK, Sun LL, Wen C |
1045 - 1047 |
A gradational lead screw dry vacuum pump Akutsu I, Matsuoka T, Ozaki M, Kyuko T, Miyashita S, Ozawa T, Naka M, Ohnishi H, Narahara Y, Horikoshi G |