화학공학소재연구정보센터
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No. Article
1 Extreme ultraviolet mask fabrication with high inspection contrast TaSiNx absorber stack
Wasson JR, Weisbrod EJ, Lu B, Mangat PJS, Dauksher WJ, Resnick DJ, Sohn J, Engelstad R, Pettibone D
Journal of Vacuum Science & Technology B, 21(6), 3086, 2003
2 Proximity and heating effects during electron-beam patterning of ultraviolet lithography masks
Lu B, Wasson JR, Weisbrod EJ, Masnyj Z, Mangat PJS, Nordquist K, Resnick D
Journal of Vacuum Science & Technology B, 20(6), 3029, 2002
3 Writing, repairing, and inspecting of extreme ultraviolet lithography reticles considering the impact of the materials
Wasson JR, Lu B, Mangat PJS, Nordquist K, Resnick DJ
Journal of Vacuum Science & Technology B, 19(6), 2635, 2001
4 Cr absorber etch process for extreme ultraviolet lithography mask fabrication
Smith KH, Wasson JR, Mangat PJS, Dauksher WJ, Resnick DJ
Journal of Vacuum Science & Technology B, 19(6), 2906, 2001
5 Experimental evaluation of an optimized radiation cooling geometry for ion projection lithography masks
Torres JL, Nounu HN, Wasson JR, Wolfe JC, Lutz J, Haugeneder E, Loschner H, Stengl G, Kaesmaier R
Journal of Vacuum Science & Technology B, 18(6), 3207, 2000
6 TaSiN thin-film pattern transfer optimization for 200 mm SCALPEL and extreme ultraviolet lithography masks
Dauksher WJ, Resnick DJ, Clemens SB, Standfast DL, Masnyj ZS, Wasson JR, Bergmann NM, Han SI, Mangat PJS
Journal of Vacuum Science & Technology B, 18(6), 3232, 2000
7 Ion absorbing stencil mask coatings for ion beam lithography
Wasson JR, Torres JL, Rampersad HR, Wolfe JC, Ruchhoeft P, Herbordt M, Loschner H
Journal of Vacuum Science & Technology B, 15(6), 2214, 1997