화학공학소재연구정보센터
검색결과 : 7건
No. Article
1 Study of electronic structures for Fe thin films deposited on Si- and C-faces of 4H-SiC substrates by soft X-ray emission spectroscopy
Hirai M, Wakita T, Okazaki H, Koishihara D, Muraoka Y, Yokoya T
Applied Surface Science, 254(1), 26, 2007
2 Reconstruction of cleaved 6H-SiC surfaces
Starke U, Tallarida M, Kumar A, Horn K, Seifarth O, Kipp L
Materials Science Forum, 457-460, 391, 2004
3 Tailoring the SiC subsurface stacking by the chemical potential
Starke U, Bernhardt J, Schardt J, Seubert A, Heinz K
Materials Science Forum, 457-460, 415, 2004
4 Interface electronic structures of transition metal(Cr, Fe) on 6H(4H)-SiC(0001)Si face by soft X-ray fluorescence spectroscopy
Hirai M, Kamezawa C, Azatyan S, An Z, Shinagawa T, Fujisawa T, Kusaka M, Iwani M
Materials Science Forum, 457-460, 427, 2004
5 Electrical activation of implanted phosphorus ions in (0001)/(11(2)over-bar0)-oriented 4H-SiC
Schmid F, Laube M, Pensl G, Wagner G, Maier M
Materials Science Forum, 389-3, 787, 2002
6 Surface reconstruction on SiC(0001) and SiC(0001): Atomic structure and potential application for oxidation, stacking and growth
Starke U
Materials Science Forum, 353-356, 205, 2001
7 High resolution electron energy loss spectroscopy of root 3 x root 3 6H-SiC(0001)
Takahashi K, Uchida M, Kitabatake M
Materials Science Forum, 338-3, 357, 2000