검색결과 : 7건
No. | Article |
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1 |
Study of electronic structures for Fe thin films deposited on Si- and C-faces of 4H-SiC substrates by soft X-ray emission spectroscopy Hirai M, Wakita T, Okazaki H, Koishihara D, Muraoka Y, Yokoya T Applied Surface Science, 254(1), 26, 2007 |
2 |
Reconstruction of cleaved 6H-SiC surfaces Starke U, Tallarida M, Kumar A, Horn K, Seifarth O, Kipp L Materials Science Forum, 457-460, 391, 2004 |
3 |
Tailoring the SiC subsurface stacking by the chemical potential Starke U, Bernhardt J, Schardt J, Seubert A, Heinz K Materials Science Forum, 457-460, 415, 2004 |
4 |
Interface electronic structures of transition metal(Cr, Fe) on 6H(4H)-SiC(0001)Si face by soft X-ray fluorescence spectroscopy Hirai M, Kamezawa C, Azatyan S, An Z, Shinagawa T, Fujisawa T, Kusaka M, Iwani M Materials Science Forum, 457-460, 427, 2004 |
5 |
Electrical activation of implanted phosphorus ions in (0001)/(11(2)over-bar0)-oriented 4H-SiC Schmid F, Laube M, Pensl G, Wagner G, Maier M Materials Science Forum, 389-3, 787, 2002 |
6 |
Surface reconstruction on SiC(0001) and SiC(0001): Atomic structure and potential application for oxidation, stacking and growth Starke U Materials Science Forum, 353-356, 205, 2001 |
7 |
High resolution electron energy loss spectroscopy of root 3 x root 3 6H-SiC(0001) Takahashi K, Uchida M, Kitabatake M Materials Science Forum, 338-3, 357, 2000 |