검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Structural characterization of 14-3-3 zeta in complex with the human Son of sevenless homolog 1 (SOS1) Ballone A, Centorrino F, Wolter M, Ottmann C Journal of Structural Biology, 202(3), 210, 2018 |
| 2 |
Transient exposure to proteins SOX2, Oct-4, and NANOG immortalizes exhausted tumor-infiltrating CTLs Bhadurihauck A, Li L, Li QQ, Wang JJ, Xiao ZG Biochemical and Biophysical Research Communications, 473(4), 1255, 2016 |
| 3 |
Dihydropyridine-fused and pyridine-fused coumarins: Reduction on a glassy carbon electrode in dimethylformamide Nunez-Vergara LJ, Pardo-Jimenez V, Barrientos C, Olea-Azar CA, Navarrete-Encina PA, Squella JA Electrochimica Acta, 85, 336, 2012 |
| 4 |
Thin-film devices for low power applications Monfra S, Fenouillet-Beranger C, Bidal G, Boeuf F, Denorme S, Huguenin JL, Samson MP, Loubet N, Hartmann JM, Campidelli Y, Destefanis V, Arvet C, Benotmane K, Clement L, Faynot O, Skotnicki T Solid-State Electronics, 54(2), 90, 2010 |
| 5 |
Folded fully depleted FET using Silicon-On-Nothing technology as a highly W-scaled planar solution Bidal G, Loubet N, Fenouillet-Beranger C, Denorme S, Perreau P, Fleury D, Clement L, Laviron C, Leverd F, Gouraud P, Barnola S, Beneyton R, Torres A, Duluard C, Chapon JD, Orlando B, Salvetat T, Grosjean M, Deloffre E, Pantel R, Dutartre D, Monfray S, Ghibaudo G, Boeuf F, Skotnicki T Solid-State Electronics, 53(7), 735, 2009 |
| 6 |
Study of SiO2/Si interface properties of SON MOSFETs by random telegraph signal and charge pumping measurements Ferraton S, Militaru L, Souifi A, Monfray S, Skotnicki T Solid-State Electronics, 52(1), 44, 2008 |
| 7 |
Modeling and simulation of STacked gate oxide (STGO) architecture in silicon-on-nothing (SON) MOSFET Kasturi P, Saxena M, Gupta RS Solid-State Electronics, 49(10), 1639, 2005 |
| 8 |
Emerging silicon-on-nothing (SON) devices technology Monfray S, Skotnicki T, Fenouillet-Beranger C, Carriere N, Chanemougame D, Morand Y, Descombes S, Talbot A, Dutartre D, Jenny C, Mazoyer P, Palla R, Leverd F, Le Friec Y, Pantel R, Borel S, Louis D, Buffet N Solid-State Electronics, 48(6), 887, 2004 |
| 9 |
Voltammetry of surface redox processes perturbed by a father-son reaction Calvente JJ, Gil ML, Sanchez MD, Andreu R, de Pablos F Electrochimica Acta, 45(19), 3087, 2000 |