검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Investigation of phosphorus diffused back surface field (BSF) in bifacial nFAB solar cells Yan X, Wang EC, Chen N, Zhang L, Gong XX, Zhang XY, Duttagupta S Solar Energy, 179, 335, 2019 |
| 2 |
A new method to characterize dopant profiles in NMOSFETs using conventional transmission electron microscopy Kawamura K, Ikeda K, Terauchi M Applied Surface Science, 237(1-4), 621, 2004 |
| 3 |
Carrier concentration dependence of the scanning capacitance microscopy signal in the vicinity of p-n junctions Kopanski JJ, Marchiando JF, Rennex BG Journal of Vacuum Science & Technology B, 18(1), 409, 2000 |
| 4 |
Quantitative two-dimensional profiling of 0.35 mu m transistors with lightly doped drain structures McDonald A, Mahaffy R, Wang XD, Kuklewicz C, Shih CK, Dennis M, Tiffin D, Kadoch D, Duane M Journal of Vacuum Science & Technology B, 18(1), 572, 2000 |
| 5 |
Cross-sectional nano-spreading resistance profiling De Wolf P, Clarysse T, Vandervorst W, Hellemans L, Niedermann P, Hanni W Journal of Vacuum Science & Technology B, 16(1), 355, 1998 |
| 6 |
Improved Analysis of Spreading Resistance Measurements Dunham ST, Collins N, Jeng N Journal of Vacuum Science & Technology B, 12(1), 283, 1994 |