Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology A, Vol.13, No.3, 614-622, 1995 DOI10.1116/1.579795 Export Citation Electrical-Transport Properties of Hot-Electrons at Metal, Insulator, and Semiconductor Interfaces Ludeke R, Bauer A Keywords:EMISSION MICROSCOPY;IMPACT IONIZATION;SILICON DIOXIDE;SPECTROSCOPY;SCATTERING;FILMS Please enable JavaScript to view the comments powered by Disqus.
