Using low-energy electron diffraction (LEED) the deposition of Ag on 4H-SiC(0001) was investigated. Ag layers of 0.2, 0.5 and 1 ML coverage were deposited on the clean (3x3) and (root3 x root3)R30degrees surface phases. The structural development after room temperature deposition as well as after annealing was studied. The (3x3) surface reconstruction is only marginally influenced by disordered Ag, while the (root3 x root3)R30degrees phase shows significant effects upon Ag deposition and thermally induced diffusion. After Ag desorption the original surface structures reappear.