화학공학소재연구정보센터
Thin Solid Films, Vol.518, No.8, 1883-1891, 2010
Structural characterization of sputtered single-phase gamma''' iron nitride coatings
Single-phase gamma'"-FeN films were deposited by d.c. magnetron sputtering in a reactive Ar/N(2) atmosphere. The films were characterized by X-ray diffraction, scanning and transmission electron microscopies, electron energy-loss and Mossbauer spectroscopy. The average lattice parameter of the gamma'" cubic cell is 0.455 nm. Microstructure studies by electron microscopies revealed nanostructured columnar films with no preferential orientation. Diffraction peak intensities (X-ray and electron diffraction) are close to the theoretical values for a ZnS-type structure while profile analysis of the X-ray diffraction pattern using Rietveld refinement method demonstrated that the gamma'"-phase is of ZnS-type. The energy-loss near-edge structures of N K-edge of the gamma'"-phase is similar to those of the ZnS-type gamma'"-phase suggesting an identical local atomic environment for N atoms. On the contrary, Mossbauer spectra of both structures are different, which is understood as a consequence of numerous vacancies in the gamma'" structure. Investigations of magnetic properties showed that the gamma'"-FeN compound is paramagnetic from room temperature to 2 K. The main conclusion of this work is that the gamma'"-FeN phase is of ZnS-type, and not of NaCl-type as it is usually reported. (C) 2009 Elsevier B.V. All rights reserved.