E41 - E43 |
One-Step Synthesis of a 12CaO center dot 7Al(2)O(3) Electride via the Spark Plasma Sintering (SPS) Method Chung JH, Ryu JH, Eun JW, Choi BG, Shim KB |
G57 - G59 |
Thickness-Dependent Magnetic Properties of Bismuth Ferrite Thin Films Wu JG, Wang J, Xiao DQ, Zhu JG |
J81 - J83 |
Low Temperature Operable CO2 Gas Sensor Based on Trivalent Aluminum Ion Conducting Solid Nagai T, Tamura S, Imanaka N |
K67 - K69 |
Impact of Process Induced Defects on the Contact Characteristics of Ti/Graphene Devices Liu WJ, Yu HY, Wei J, Li MF |
S11 - S11 |
Inhibition of the Electrostatic Force-Induced Atomic Migration in Ge2Sb2Te5 by Nitrogen Doping (vol 13, pg H321, 2010) Yang TY, Cho JY, Joo YC |
A171 - A173 |
Electrochemical Properties of an All-Organic Redox Flow Battery Using 2,2,6,6-Tetramethyl-1-Piperidinyloxy and N-Methylphthalimide Li Z, Li S, Liu SQ, Huang KL, Fang D, Wang FC, Peng S |
A174 - A176 |
Microporous Carbon-Based Electrical Double Layer Capacitor Operating at High Temperature in Ionic Liquid Electrolyte Largeot C, Taberna PL, Gogotsi Y, Simon P |
A177 - A179 |
Electrochemical Mechanism of Amorphous Boron Oxide Thin Film with Lithium Ding XL, Zhou YN, Yang Y, Sun Q, Lu F, Fu ZW |
A180 - A184 |
Chemical Anchoring of Ag Nanoparticles to Si Surfaces and Its Application in Lithium Ion Batteries Yang SN, Pan QM |
A185 - A188 |
Decomposition Reaction of Lithium Bis(oxalato)borate in the Rechargeable Lithium-Oxygen Cell Oh SH, Yim T, Pomerantseva E, Nazar LF |
A189 - A191 |
Valence Band Offsets of LiPON/LiCoO2 Hetero-Interfaces Determined by X-ray Photoelectron Spectroscopy Song J, Jacke S, Cherkashinin G, Schmid S, Dong QF, Hausbrand R, Jaegermann W |
B127 - B131 |
Effects of Temperature and Carbon Dioxide on Anion Exchange Membrane Conductivity Grew KN, Ren XM, Chu D |
B132 - B134 |
Mitigating Cr Contamination by Hot Air Filtering in Solid Oxide Fuel Cells Schuler JA, Schuler AJ, Penner D, Hessler-Wyser A, Ludwig C, Van Herle J |
D107 - D109 |
A Synergy Effect of 2-MBT and PE-3650 on the Bottom-Up Filling in Electroless Copper Plating Zan LX, Liu ZH, Yang ZP, Wang ZL |
D110 - D115 |
Electrochemical Preparation of Nickel and Iron Nanoparticles in a Hydrophobic Ionic Liquid Zhu YL, Katayama Y, Miura T |
H475 - H477 |
Influence of Oxygen Partial Pressure on Resistance Random Access Memory Characteristics of Indium Gallium Zinc Oxide Chen MC, Chang TC, Huang SY, Chang GC, Chen SC, Huang HC, Hu CW, Sze SM, Tsai TM, Gan DS, Yeh FS, Tsai MJ |
H478 - H479 |
X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H/Cu Interfaces King SW, French M, Bielefeld J, Jaehnig M, Kuhn M, French B |
H480 - H482 |
Polymorphism of Amorphous Ge2Sb2Te5 Probed by EXAFS and Raman Spectroscopy Carria E, Mio AM, Gibilisco S, Miritello M, d'Acapito F, Grimaldi MG, Rimini E |
H483 - H486 |
Electroplating of Copper-Nickel Thin Films and Narrow Trenches Suh H, Keum D, Kim JG, Song K, Ko YD, Chung JS, Hong K |
H487 - H490 |
Effective Schottky Barrier Height Modulation by an Ultrathin Passivation Layer of GeOxNy for Al/n-Ge(100) Contact Jiang YL, Xie Q, Qu XP, Ru GP, Zhang DW, Deduytsche D, Detavernier C |
H491 - H493 |
Effect of Indium Contents on the Solution-Processed SiInZnO Thin Film Transistors Annealed at Low Temperature Park KH, Chong E, Ju BK, Lee SY |