Thin Solid Films

Thin Solid Films, Vol.516, No.22 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (47 articles)

7953 - 7954	Proceedings of the EMRS 2007 Fall Meeting Symposium H: Current Trends in Optical and X-Ray Metrology of Advanced Materials and Devices II, Warsaw, Poland Servet B, Tomozeiu N, Modreanu M, Durand O, Jellison GE, Massies J
7955 - 7961	Analysis of water condensation in P123 templated 2D hexagonal mesoporous silica films by X-ray reflectivity Yan MH, Dourdain S, Gibaud A
7962 - 7966	The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin Matyi RJ, Depero LE, Bontempi E, Colombi P, Gibaud A, Jergel M, Krumrey M, Lafford TA, Lamperti A, Meduna M, Van der Lee A, Wiemer C
7967 - 7973	Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques Galicka-Fau K, Legros C, Andrieux M, Herbst-Ghysel M, Gallet I, Condat M, Durand O, Servet B
7974 - 7978	Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy Edon V, Hugon MC, Agius B, Durand O, Eypert C, Cardinaud C
7979 - 7989	Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry Hilfiker JN, Singh N, Tiwald T, Convey D, Smith SM, Baker JH, Tompkins HG
7990 - 7995	Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion Sancho-Parramon J, Modreanu M, Bosch S, Stchakovsky M
7996 - 8001	Use of Voigt oscillators to characterize microelectronics materials by Infrared Spectroscopic Ellipsometry Gilliot M, Piel JP
8002 - 8008	In-situ and real-time protein adsorption study by Spectroscopic Ellipsometry Lousinian S, Logothetidis S
8009 - 8012	Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ions Lohner T, Angelov C, Mikli V
8013 - 8021	Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies Budai JD, Liu W, Tischler JZ, Pan ZW, Norton DP, Larson BC, Yang W, Ice GE
8022 - 8028	Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space Holy V, Mundboth K, Mokuta C, Metzger TH, Stangl J, Bauer G, Boeck T, Schmidbauer M
8029 - 8035	Optimization of metallic X-ray capillary production Mrouka R, Bartosik P, Sawlowicz Z, Skrzypiec K, Falkenberg G, Wojcik J, Zukocinski G, Kuczumow A
8036 - 8041	Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction Zolotoyabko E
8042 - 8048	Influence of crystallographic orientation on local strains in silicon: A combined high-resolution X-ray diffraction and finite element modelling investigation Eberlein M, Escoubas S, Gailhanou M, Thomas O, Rohr P, Coppard R
8049 - 8058	Determination of the fundamental and spin-orbit-splitting band gap energies of InAsSb-based ternary and pentenary alloys using mid-infrared photoreflectance Cripps SA, Hosea TJC, Krier A, Smirnov V, Batty PJ, Zhuang QD, Lin HH, Liu PW, Tsai G
8059 - 8063	Mid-IR characterization of photonic bands in 2D photonic crystals on silicon Kral Z, Ferre-Borrull J, Trifonov T, Marsal LF, Rodriguez A, Pallares J, Alcubilla R
8064 - 8072	Light depolarization induced by sharp metallic tips and effects on Tip-Enhanced Raman Spectroscopy Gucciardi PG, Bonaccorso F, Lopes M, Billot L, de la Chapelle ML
8073 - 8076	Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements Kondilis A, Aperathitis E, Modreanu A
8077 - 8081	Topography description of thin films by optical Fourier Transform Jaglarz J
8082 - 8086	Sub-pixel detection of a grid's node positions for optical diagnostics Lukacs IE, Riesz F
8087 - 8091	Makyoh-topography study of the swirl defect in Si wafers Riesz F, Pap AE, Adam M, Lukacs IE
8092 - 8095	Influence of the GaAs substrate orientation on the composition of GaxIn1-xP (x approximate to 0.5) grown by LPE and MOCVD Mishumyi VA, de Anda F, Gorbatchev AY, Kudriavtsev Y, Elyukhin VA, Prutskij T, Pelosi C, Bocchi C, Ber BY, Vazquez FEO
8096 - 8100	Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction Serenyi M, Lohner T, Petrik P, Zolnai Z, Horvath ZE, Khanh NQ
8101 - 8105	Effect of multi-layered bottom electrodes on the orientation of strontium-doped lead zirconate titanate thin films Bhaskaran M, Sriram S, Mitchell DRG, Short KT, Holland AS
8106 - 8111	Reconstruction of lattice structure of ion-implanted near-surface regions of Hg1-XCdXTe epitaxial layers Vlasov AP, Bonchyk OY, Kiyak SG, Fodchuk IM, Zaplitnyy RM, Kazemirskiy T, Barcz A, Zieba PS, Swiatek Z, Maziarz W
8112 - 8116	Hydroxyapatite films obtained by sol-gel and sputtering Stoica TF, Morosanu C, Slav A, Stoica T, Osiceanu P, Anastasescu C, Gartner M, Zaharescu A
8117 - 8124	X-ray diffraction peak profile analysis aiming at better understanding of the deformation process and deformed structure of a martensitic steel Garabagh MRM, Nedjad SH, Shirazi H, Mobarekeh MI, Ahmadabadi MN
8125 - 8129	Influence of Nd dopants on lattice parameters and thermal and elastic properties in YVO4 single crystals Kucytowski J, Wokulska K, Kamierezak-Balata A, Bodzenta J, Lukasiewicz T, Hofman B, Pyka A
8130 - 8135	Defects in CU2O, CuAlO2 and SrCU2O2 transparent conducting oxides Nolan M
8136 - 8140	An RBS study of thin PLD and MOCVD strontium copper oxide layers Kantor Z, Papadopoulou EL, Aperathitis E, Deschanvres JL, Somogyi K, Szendro I
8141 - 8145	Undoped and Al-doped ZnO films with tuned properties grown by pulsed laser deposition Papadopoulou EL, Varda M, Kouroupls-Agalou K, Androulidaki M, Chikoidze E, Galtier P, Huyberechts G, Aperathitis E
8146 - 8149	Effect of chlorine doping on electrical and optical properties of ZnO thin films Chikoidze E, Nolan M, Modreanu M, Sallet V, Galtier P
8150 - 8153	Influence of illumination and decay of electrical resistance of ITO nanoscale layers Somogyi K, Erdelyi K, Szendro I
8154 - 8158	The effect of PLD deposition parameters on the properties of p-SrCu2O2/n-Si diodes Papadopoulou EL, Varda M, Pennos A, Kaloudis M, Kayambaki A, Androulidaki A, Tsagaraki K, Viskadourakis Z, Durand O, Huyberechts G, Aperathitis E
8159 - 8164	Transparent thin-film transistors with zinc oxide semiconductor fabricated by reactive sputtering using metallic zinc target Cheong WS, Ryu MK, Shin JH, Park SHK, Hwang CS
8165 - 8169	Combination of the optical waveguide lightmode spectroscopy method with electrochemical measurements Szendro I, Erdelyi K, Fabian M, Puskas Z, Adanyi N, Somogyi K
8170 - 8174	Optical properties of zinc nitride thin films fabricated by rf-sputtering from ZnN target Voulgaropouou P, Dounis S, Kambilafka V, Androulidaki M, Ruzinsky M, Saly V, Prokein P, Viskadourakis Z, Tsagaraki K, Aperathitis E
8175 - 8178	Photoelectrochemical studies of semiconducting photoanodes for hydrogen production via water dissociation Paulauskas IE, Katz JE, Jellison GE, Lewis NS, Boatner LA
8179 - 8183	Optical properties of nanocrystalline titanium oxide Plugaru R
8184 - 8189	Investigation on the nitrogen doping of multilayered, porous TiO2 thin films Gartner M, Osiceanu P, Anastasescu M, Stoica T, Stoica TF, Trapalis C, Glannakopoulou T, Todorova N, Lagoyannis A
8190 - 8194	Depth profiling Raman spectroscopy of a thin YBa(2)Cu(3)O(7-delta) film Branescu M, Naudin C, Gartner M, Nemes G
8195 - 8198	Lifetime improvement of organic light-emitting diodes using silicon oxy-nitride as anode modifier Wong FL, Chan MY, Lai SL, Fung MK, Lai KH, Tsang WM, Ng TW, Poon CO, Lee CS, Lee ST
8199 - 8204	Electrical conduction and dielectric relaxation of a-SiO(x) (0 < x < 2) thin films deposited by reactive RF magnetron sputtering Tomozeiu N
8205 - 8209	Structure, composition, morphology and electrical properties of amorphous SiO(x) (0 < x < 2) thin films Tomozeiu N, Rheiter HJH
8210 - 8214	Ceramic materials Ba(1-x)SrxTiO3 for electronics - Synthesis and characterization Berbecaru C, Alexandru HV, Porosnicu C, Velea A, Ioachim A, Nedelcu L, Tonsan M
8215 - 8218	Surface scattering optical loss measurements in thin oxide planar waveguide layers Szendro I, Puskas Z, Somogyi K, Erdelyi K