검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Heteroepitaxial growth of Ge on compliant strained nano-structured Si lines and dots on (001) silicon on insulator substrate Zaumseil P, Yamamoto Y, Schubert MA, Schroeder T, Tillack B Thin Solid Films, 557, 50, 2014 |
| 2 |
Stoichiometry-structure correlation of epitaxial Ce1-xPrxO2-delta (X=0-1) thin films on Si(111) Zoellner MH, Zaumseil P, Wilkens H, Gevers S, Wollschlager J, Baumer M, Xie YH, Niu G, Schroeder T Journal of Crystal Growth, 355(1), 159, 2012 |
| 3 |
Low threading dislocation Ge on Si by combining deposition and etching Yamamoto Y, Kozlowski G, Zaumseil P, Tillack B Thin Solid Films, 520(8), 3216, 2012 |
| 4 |
Preparation and characterization of Ge epitaxially grown on nano-structured periodic Si pillars and bars on Si(001) substrate Zaumseil P, Yamamoto Y, Bauer J, Schubert MA, Matejova J, Kozlowski G, Schroeder T, Tillack B Thin Solid Films, 520(8), 3240, 2012 |
| 5 |
Optical properties and band gap characterization of high dielectric constant oxides Fursenko O, Bauer J, Lupina G, Dudek P, Lukosius M, Wenger C, Zaumseil P Thin Solid Films, 520(14), 4532, 2012 |
| 6 |
Low threading dislocation density Ge deposited on Si (100) using RPCVD Yamamoto Y, Zaumseil P, Arguirov T, Kittler M, Tillack B Solid-State Electronics, 60(1), 2, 2011 |
| 7 |
On the band gaps and electronic structure of thin single crystalline praseodymium oxide layers on Si(111) Seifarth O, Dabrowski J, Zaumseil P, Muller S, Schmeisser D, Mussig HJ, Schroeder T Journal of Vacuum Science & Technology B, 27(1), 271, 2009 |
| 8 |
Structure and defects of epitaxial Si(111) layers on Y2O3(111)/Si(111) support systems Borschel C, Ronning C, Hofsass H, Giussani A, Zaumseil P, Wenger C, Storck P, Schroeder T Journal of Vacuum Science & Technology B, 27(1), 305, 2009 |
| 9 |
Thermal oxidation of chemical vapour deposited tungsten layers on silicon substrates for embedded non-volatile memory application Sohal R, Walczyk C, Zaumseil P, Wolansky D, Fox A, Tillack B, Mussig HJ, Schroeder T Thin Solid Films, 517(16), 4534, 2009 |
| 10 |
Morphology and composition of selected high-k materials and their relevance to dielectric properties of thin films Dabrowski J, Lippert G, Oberbeck L, Schroder U, Costina I, Lupina G, Ratzke M, Zaumseil P, Muessig HJ Journal of the Electrochemical Society, 155(5), G97, 2008 |