검색결과 : 2건
No. | Article |
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1 |
Focused ion beam tomography of a microelectronic device with sub-2-nm resolution Yeoh TS, Ives NA, Presser N, Stupian GW, Leung MS, McCollum JL, Hawley FW Journal of Vacuum Science & Technology B, 25(3), 922, 2007 |
2 |
Controlled fabrication of InGaAs quantum dots by selective area epitaxy MOCVD growth Elarde VC, Yeoh TS, Rangarajan R, Coleman JJ Journal of Crystal Growth, 272(1-4), 148, 2004 |