검색결과 : 33건
| No. | Article |
|---|---|
| 1 |
Simulation and characterization on properties of AlN films for SOI application Song ZR, Yu YH, Zou SC, Zheng ZH, Shen DS, Luo EZ, Xie Z, Sundaravel B, Wong SP, Wilson IH Thin Solid Films, 459(1-2), 41, 2004 |
| 2 |
Characterization of nano-sized Si islands in buried oxide layer of SIMOX by Conducting AFM Chen KW, Yu YH, Luo EZ, Xie Z, Xu JB, Wilson IH, Bishop WY, Shen DS Chemical Physics Letters, 376(5-6), 748, 2003 |
| 3 |
XTEM characterization of tungsten implanted SiC thin films on silicon for field emission devices Lindner JKN, Tsang WM, Wong SP, Xu JB, Wilson IH Thin Solid Films, 427(1-2), 417, 2003 |
| 4 |
Photo-stimulated current spectroscopy and its application in detecting aluminum implantation-induced deep traps in GaN Xu XL, He HY, Liu HT, Shi CS, Ge WK, Luo EZ, Sundaravel B, Wilson IH Thin Solid Films, 416(1-2), 294, 2002 |
| 5 |
Non-Rutherford backscattering studies of SiC/SIMOX structures Chen KW, Yu YH, Lei YM, Cheng LL, Sundaraval B, Luo EZ, Wong SP, Wilson IH, Chen LZ, Ren CX, Zou SC Applied Surface Science, 184(1-4), 178, 2001 |
| 6 |
Evolution of Fe-rich precipitates in Fe implanted Ge(110) surfaces as observed by scanning Auger microscopy Venugopal R, Sundaravel B, Wilson IH Applied Surface Science, 185(1-2), 60, 2001 |
| 7 |
Electron field emission characteristics of textured silicon surface Fung YM, Cheung WY, Wilson IH, Chen DH, Xu JB, Wong SP, Kwok RWM Journal of Vacuum Science & Technology B, 19(3), 884, 2001 |
| 8 |
Structural and optical properties of SiC films deposited on Si by DG magnetron sputtering Lei YM, Yu YH, Cheng LL, Lin L, Sundaraval B, Luo EZ, Lin S, Ren CX, Cheung WY, Wong SP, Xu JB, Zou SC, Wilson IH Materials Science Forum, 353-356, 191, 2001 |
| 9 |
Scanning tunneling microscopy and ion channeling studies of thin Co films on bromine-treated Si(100) surfaces Sekar K, Sundaravel B, Wilson IH, Heiland W Applied Surface Science, 156(1-4), 161, 2000 |
| 10 |
Ti, TiN, and Ti/TiN thin films prepared by ion beam assisted deposition as diffusion barriers between Cu and Si Mu HC, Yu YH, Luo EZ, Sundaravel B, Wong SP, Wilson IH Journal of Vacuum Science & Technology A, 18(5), 2312, 2000 |