검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab Wiesmann J, Graf J, Hoffmann C, Hembd A, Michaelsen C, Yang N, Cordes H, He B, Preckwinkel U, Erlacher K Particle & Particle Systems Characterization, 26(3), 112, 2009 |
| 2 |
State-of-the-art of multilayer optics for laboratory X-ray devices Hertlein F, Oehr A, Hoffmann C, Michaelsen C, Wiesmann J Particle & Particle Systems Characterization, 22(6), 378, 2006 |