검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films Voogt FC, Ishihara R Thin Solid Films, 383(1-2), 45, 2001 |
| No. | Article |
|---|---|
| 1 |
A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films Voogt FC, Ishihara R Thin Solid Films, 383(1-2), 45, 2001 |