검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Structure properties and electrical mechanisms of Si(001)/SiO2 interface with varying Si layer thickness in nano-scale transistor Li H, Ji A, Zhu C, Mao LF Current Applied Physics, 18(9), 1020, 2018 |
| 2 |
Structure properties and electrical mechanisms of Si(001)/SiO2 interface with varying Si layer thickness in nano-scale transistor Li H, Ji A, Zhu C, Mao LF Current Applied Physics, 18(9), 1020, 2018 |
| 3 |
Interface structure between silicon and its oxide by first-principles molecular dynamics Pasquarello A, Hybertsen MS, Car R Nature, 396(6706), 58, 1998 |
| 4 |
The Evolution of (001)Si/SiO2 Interface Roughness During Thermal-Oxidation Fang SJ, Chen W, Yamanaka T, Helms CR Journal of the Electrochemical Society, 144(8), 2886, 1997 |