검색결과 : 72건
No. | Article |
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1 |
New insight into the mechanism of enhanced photo-Fenton reaction efficiency for Fe-doped semiconductors: A case study of Fe/g-C3N4 Li KY, Liang Y, Yang H, An SF, Shi HN, Song CS, Guo XW Catalysis Today, 371, 58, 2021 |
2 |
The structural and optical properties of metallic doped copper (I) iodide thin films synthesized by SILAR method Ighodalo KO, Obi D, Agbogu A, Ezealigo BN, Nwanya AC, Mammah SL, Bucher R, Maaza M, Ezema FI Materials Research Bulletin, 94, 528, 2017 |
3 |
Doping induces large variation in the electrical properties of MoS2 monolayers Eshun K, Xiong HD, Yu S, Li QL Solid-State Electronics, 106, 44, 2015 |
4 |
Low temperature RPCVD epitaxial growth of Si1-xGex using Si2H6 and Ge2H6 Wirths S, Buca D, Tiedemann AT, Bernardy P, Hollander B, Stoica T, Mussler G, Breuer U, Mantl S Solid-State Electronics, 83, 2, 2013 |
5 |
Low Frequency Noise Analysis of Top-Gate MgZnO Thin-Film Transistor with High-kappa ZrO2 Gate Insulator Chiu HC, Wang HC, Lin CK, Chiu CW, Fu JS, Hsueh KP, Chien FT Electrochemical and Solid State Letters, 14(9), H385, 2011 |
6 |
Regrowth of High Quality Heavily Si-Doped nGaN Utilizing Nano-Rod GaN Template Kuo CH, Chang LC, Chou HM Journal of the Electrochemical Society, 158(10), H961, 2011 |
7 |
Metal Reaction Doping and Ohmic Contact with Cu-Mn Electrode on Amorphous In-Ga-Zn-O Semiconductor Yun PS, Koike J Journal of the Electrochemical Society, 158(10), H1034, 2011 |
8 |
Gallium Implantation and Diffusion in Crystalline Germanium Ioannou N, Skarlatos D, Vouroutzis NZ, Georga SN, Krontiras CA, Tsamis C Electrochemical and Solid State Letters, 13(3), H70, 2010 |
9 |
Red Emission Through Radiative Energy Transfer from Wavelength-Tunable Zn1-xCdxO Layers to Y2O3:Eu3+ Phosphor Films Chong MK, Vu QV, Pita K Electrochemical and Solid State Letters, 13(5), J50, 2010 |
10 |
Improvement of PECVD Silicon-Germanium Crystallization for CMOS Compatible MEMS Applications Guo B, Severi S, Bryce G, Claes G, Van Hoof R, Du Bois B, Haspeslagh L, Witvrouw A, Decoutere S Journal of the Electrochemical Society, 157(2), D103, 2010 |