| 1 |
Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications
Steffens J, Fazio MA, Cavalcoli D, Terheiden B
Solar Energy Materials and Solar Cells, 187, 104, 2018 |
| 2 |
Microstructure and ellipsometric modelling of the optical properties of very thin silver films for application in plasmonics
Todorov R, Lozanova V, Knotek P, Cernoskova E, Vlcek M
Thin Solid Films, 628, 22, 2017 |
| 3 |
Photocatalytic degradation of TCE in dry and wet air conditions with TiO2 porous thin films
Suarez S, Arconada N, Castro Y, Coronado JM, Portela R, Duran A, Sanchez B
Applied Catalysis B: Environmental, 108(1-2), 14, 2011 |
| 4 |
Photocatalytic properties in aqueous solution of porous TiO2-anatase films prepared by sol-gel process
Arconada N, Castro Y, Duran A
Applied Catalysis A: General, 385(1-2), 101, 2010 |
| 5 |
Structural and optical properties of both pure poly (3-octylthiophene) (P3OT) and P3OT/fullerene films
Erb T, Raleva S, Zhokhavets U, Gobsch G, Stuhn B, Spode M, Ambacher O
Thin Solid Films, 450(1), 97, 2004 |
| 6 |
Advances in multichannel spectroscopic ellipsometry
Collins RW, An I, Fujiwara H, Lee JC, Lu YW, Koh JY, Rovira PI
Thin Solid Films, 313-314, 18, 1998 |
| 7 |
Simple Equipment Tolerant Reflectometry for Monitoring of Molecular-Beam Epitaxy and Metalorganic Chemical-Vapor-Deposition Growth
Bean JC, Peticolas LJ, Lum R, Mcdonald ML
Journal of Vacuum Science & Technology A, 14(3), 946, 1996 |
| 8 |
Real-Time Monitoring of Resonant-Tunneling Diode Growth Using Spectroscopic Ellipsometry
Celii FG, Kao YC, Katz AJ, Moise TS
Journal of Vacuum Science & Technology A, 13(3), 733, 1995 |
