Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology A, Vol.13, No.3, 733-739, 1995 DOI10.1116/1.579817 Export Citation Real-Time Monitoring of Resonant-Tunneling Diode Growth Using Spectroscopic Ellipsometry Celii FG, Kao YC, Katz AJ, Moise TS Keywords:BEAM EPITAXIAL-GROWTH;SPECTRAL ELLIPSOMETRY Please enable JavaScript to view the comments powered by Disqus.
