검색결과 : 415건
| No. | Article |
|---|---|
| 1 |
Combustion characteristics of gasoline DICI engine in the transition from HCCI to PPC: Experiment and numerical analysis Xu LL, Bai XS, Li CL, Tunestal P, Tuner M, Lu XC Energy, 185, 922, 2019 |
| 2 |
Doping profile extraction in thin SOI films: Application to A2RAM Wakam FT, Lacord J, Bawedin M, Martinie S, Cristoloveanu S, Ghibaudo G, Barbe JC Solid-State Electronics, 159, 3, 2019 |
| 3 |
New prospects on high on-current and steep subthreshold slope for innovative Tunnel FET architectures Llorente CD, Colinge JP, Martinie S, Cristoloveanu S, Wan J, Le Royer C, Ghibaudo G, Vinet M Solid-State Electronics, 159, 26, 2019 |
| 4 |
GDNMOS and GDBIMOS devices for high voltage ESD protection in thin film advanced FD-SOI technology De Conti L, Bedecarrats T, Cristoloveanu S, Vinet M, Galy P Solid-State Electronics, 159, 90, 2019 |
| 5 |
Investigation of built-in bipolar junction transistor in FD-SOI BIMOS Bedecarrats T, Galy P, Fenouillet-Beranger C, Cristoloveanu S Solid-State Electronics, 159, 177, 2019 |
| 6 |
Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET Sato S, Ghibaudo G, Benea L, Ionica I, Omura Y, Cristoloveanu S Solid-State Electronics, 159, 197, 2019 |
| 7 |
New insights on SOI Tunnel FETs with low-temperature process flow for CoolCube (TM) integration Llorente CD, Le Royer C, Batude P, Fenouillet-Beranger C, Martinie S, Lu CMV, Allain F, Colinge JP, Cristoloveanu S, Ghibaudo G, Vinet M Solid-State Electronics, 144, 78, 2018 |
| 8 |
Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures Boudier D, Cretu B, Simoen E, Veloso A, Collaert N Solid-State Electronics, 143, 27, 2018 |
| 9 |
Kink effect in ultrathin FDSOI MOSFETs Park HJ, Bawedin M, Choi HG, Cristoloveanu S Solid-State Electronics, 143, 33, 2018 |
| 10 |
Insight into carrier lifetime impact on band-modulation devices Parihar MS, Lee KH, Park HJ, Lacord J, Martinie S, Barbe JC, Xu Y, El Dirani H, Taur Y, Cristoloveanu S, Bawedin M Solid-State Electronics, 143, 41, 2018 |