검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET Ioannidis EG, Rohracher K, Roger F, Pflanzl WC, Leisenberger FP, Wachmann E, Seebacher E, Vescoli V Solid-State Electronics, 135, 1, 2017 |
| 2 |
Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET Ioannidis EG, Pflanzl WC, Stueckler E, Vescoli V, Carniello S, Seebacher E Solid-State Electronics, 126, 158, 2016 |