검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress Rhee J, Choi S, Kang H, Kim JY, Ko D, Ahn G, Jung H, Choi SJ, Kim DM, Kim DH Solid-State Electronics, 140, 90, 2018 |