검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Using a slit doser to probe gas dynamics during Al2O3 atomic layer deposition and to fabricate laterally graded Al2O3 layers Seghete D, Fabreguette FH, George SM Thin Solid Films, 519(11), 3612, 2011 |
| 2 |
Secondary electron yield measurements of carbon covered multilayer optics Chen JQ, Louis E, Verhoeven J, Harmsen R, Lee CJ, Lubomska M, van Kampen M, van Schaik W, Bijkerk F Applied Surface Science, 257(2), 354, 2010 |
| 3 |
X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab Wiesmann J, Graf J, Hoffmann C, Hembd A, Michaelsen C, Yang N, Cordes H, He B, Preckwinkel U, Erlacher K Particle & Particle Systems Characterization, 26(3), 112, 2009 |
| 4 |
Interpretation of quasi-Fermi level splitting in Cu(Ga,In)Se-2-absorbers by confocally recorded spectral luminescence and numerical modeling Knabe S, Gutay L, Bauer GH Thin Solid Films, 517(7), 2344, 2009 |
| 5 |
State-of-the-art of multilayer optics for laboratory X-ray devices Hertlein F, Oehr A, Hoffmann C, Michaelsen C, Wiesmann J Particle & Particle Systems Characterization, 22(6), 378, 2006 |
| 6 |
Performance stability of microfocusing source and multilayer optics based X-ray diffraction system Kim B, Verman B, Jiang L Materials Science Forum, 443-4, 159, 2004 |
| 7 |
Roughness Analysis of Optical Films and Substrates by Atomic-Force Microscopy Ruppe C, Duparre A Thin Solid Films, 288(1-2), 8, 1996 |