검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
On the origins of oxidation-induced stacking faults in silicon Monson TK, Van Vechten JA Journal of the Electrochemical Society, 146(2), 741, 1999 |
| 2 |
Evidence for Ostwald Ripening of Vacancy Clusters in Float-Zone Silicon Obtained from Preannealing Dependence of Gold Diffusion Behavior Monson TK, Vanvechten JA, Zhang QS Journal of the Electrochemical Society, 142(6), 2077, 1995 |