검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab Wiesmann J, Graf J, Hoffmann C, Hembd A, Michaelsen C, Yang N, Cordes H, He B, Preckwinkel U, Erlacher K Particle & Particle Systems Characterization, 26(3), 112, 2009 |
| 2 |
State-of-the-art of multilayer optics for laboratory X-ray devices Hertlein F, Oehr A, Hoffmann C, Michaelsen C, Wiesmann J Particle & Particle Systems Characterization, 22(6), 378, 2006 |
| 3 |
Ex situ characterization of phase transformations and associated microstructures in polycrystalline thin films Barmak K, Rickman JM, Michaelsen C, Ristau RA, Kim J, Lucadamo GA, Carpenter DT, Tong WS Journal of Vacuum Science & Technology A, 17(4), 1950, 1999 |
| 4 |
On the Determination of Nucleation and Growth-Kinetics by Calorimetry Michaelsen C, Dahms M Thermochimica Acta, 288(1-2), 9, 1996 |