화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Sperling BA, Kimes WA, Maslar JE
Applied Surface Science, 256(16), 5035, 2010
2 Raman spectroscopic observation of dehydrogenation in ball-milled LiNH2-LiBH4-MgH2 nanoparticles
Hattrick-Simpers JR, Maslar JE, Niemann MU, Chiu C, Srinivasan SS, Stefanakos EK, Bendersky LA
International Journal of Hydrogen Energy, 35(12), 6323, 2010
3 Time-resolved Fourier transform infrared spectroscopy of the gas phase during atomic layer deposition
Sperling BA, Kimes WA, Maslar JE, Chu PM
Journal of Vacuum Science & Technology A, 28(4), 613, 2010
4 Alloy 600 Aqueous Corrosion at Elevated Temperatures and Pressures: An In Situ Raman Spectroscopic Investigation
Maslar JE, Hurst WS, Bowers WJ, Hendricks JH, Windsor ES
Journal of the Electrochemical Society, 156(3), C103, 2009
5 Adsorption behavior of DNA-wrapped carbon nanotubes on self-assembled monolayer surfaces
Zangmeister RA, Maslar JE, Opdahl A, Tarlov MJ
Langmuir, 23(11), 6252, 2007
6 An investigation of particle dynamics in a rotating disk chemical vapor deposition reactor
Kremer DM, Davis RW, Moore EF, Maslar JE, Burgess DR, Ehrman SH
Journal of the Electrochemical Society, 150(2), G127, 2003
7 Optical flow cell and apparatus for solubility, salt deposition and Raman spectroscopic studies in aqueous solutions near the water critical point
Hurst WS, Hodes MS, Bowers WJ, Bean VE, Maslar JE, Griffith P, Smith KA
Journal of Supercritical Fluids, 22(2), 157, 2002
8 In situ Raman spectroscopic investigation of chromium surfaces under hydrothermal conditions
Maslar JE, Hurst WS, Bowers WJ, Hendricks JH, Aquino MI, Levin I
Applied Surface Science, 180(1-2), 102, 2001
9 In situ Raman spectroscopic investigation of aqueous iron corrosion at elevated temperatures and pressures
Maslar JE, Hurst WS, Bowers WJ, Hendricks JH, Aquino MI
Journal of the Electrochemical Society, 147(7), 2532, 2000
10 Structural and Electronic Effects of Argon Sputtering and Reactive Ion Etching on In0.53Ga0.47As and In0.52Al0.48As Studied by Inelastic Light-Scattering
Maslar JE, Dorsten JF, Bohn PW, Agarwala S, Adesida I, Caneau C, Bhat R
Journal of Vacuum Science & Technology B, 13(3), 988, 1995