화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Physical understanding and modeling of SANOS retention in programmed state
Furnemont A, Cacciato A, Breuil L, Rosmeulen M, Maes H, De Meyer K, Van Houdt J
Solid-State Electronics, 52(4), 577, 2008
2 Scaling CMOS: Finding the gate stack with the lowest leakage current
Kauerauf T, Govoreanu B, Degraeve R, Groeseneken G, Maes H
Solid-State Electronics, 49(5), 695, 2005
3 The Adequat Project for Development and Transfer of 0.25 Mu-M Logic Complementary Metal-Oxide-Semiconductor Modules
Dekeersmaecker R, Declerck G, Felix P, Haond M, Hill C, Janssen G, Lorenz J, Maes H, Montree A, Neppl F, Patruno P, Rudan M, Ryssel H, Vandenhove L, Vandervorst W, Vanommen A
Journal of Vacuum Science & Technology B, 12(4), 2852, 1994