검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
A voltage-dependent channel length extraction method for MOSFET's Joodaki M Solid-State Electronics, 50(11-12), 1787, 2006 |
| 2 |
L-eff extraction for sub-100 nm MOSFET devices Ye QY, Biesemans S Solid-State Electronics, 48(1), 163, 2004 |
| 3 |
Electrical properties of Si-SiO2 interface traps and evolution with oxide thickness in MOSFET's with oxides from 2.3 to 1.2 nm thick Bauza D Solid-State Electronics, 47(10), 1677, 2003 |
| 4 |
High frequency thermal noise modelling of short-channel MOSFET's Signoracci L, Turchetti C, Orcioni S Solid-State Electronics, 45(2), 205, 2001 |