검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
A comparative mismatch study of the 20 nm Gate-Last and 28 nm Gate-First bulk CMOS technologies Rahhal L, Bajolet A, Manceau JP, Rosa J, Ricq S, Lassere S, Ghibaudo G Solid-State Electronics, 108, 53, 2015 |
| No. | Article |
|---|---|
| 1 |
A comparative mismatch study of the 20 nm Gate-Last and 28 nm Gate-First bulk CMOS technologies Rahhal L, Bajolet A, Manceau JP, Rosa J, Ricq S, Lassere S, Ghibaudo G Solid-State Electronics, 108, 53, 2015 |