검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Development of certified reference materials of ion-implanted dopants in silicon for calibration of secondary ion mass spectrometers Simons DS, Downing RG, Lamaze GP, Lindstrom RM, Greenberg RR, Paul RL, Schiller SB, Guthrie WF Journal of Vacuum Science & Technology B, 25(4), 1365, 2007 |
| 2 |
Analyses of thin films and surfaces by cold neutron depth profiling Lamaze GP, Chen-Mayer HH, Soni KK Applied Surface Science, 238(1-4), 108, 2004 |
| 3 |
Cold neutron depth protiling of lithium-ion battery materials Lamaze GP, Chen-Mayer HH, Becker DA, Vereda F, Goldner RB, Haas T, Zerigian P Journal of Power Sources, 119, 680, 2003 |
| 4 |
This Cats Out of the Bag Lamaze GP Chemical & Engineering News, 73(30), 4, 1995 |
| 5 |
Effect of Stoichiometry on the Phases Present in Boron-Nitride Thin-Films Hackenberger LB, Pilione LJ, Messier R, Lamaze GP Journal of Vacuum Science & Technology A, 12(4), 1569, 1994 |