검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Surface grafting of polypyrrole onto silicon wafers Sohn D, Moon H, Fasolka MJ, Eidelman N, Koo SM, Richter CA, Park S, Kopanski JJ, Amis E Chemistry Letters, 36(10), 1210, 2007 |
| 2 |
Comparison of scanning capacitance microscopy and scanning Kelvin probe microscopy in determining two-dimensional doping profiles of Si homostructures Park SE, Nguyen NV, Kopanski JJ, Suehle JS, Vogel EM Journal of Vacuum Science & Technology B, 24(1), 404, 2006 |
| 3 |
Towards reproducible scanning capacitance microscope image interpretation Kopanski JJ, Marchiando JF, Rennex BG, Simons D, Chau Q Journal of Vacuum Science & Technology B, 22(1), 399, 2004 |
| 4 |
On calculating scanning capacitance microscopy data for a dopant profile in semiconductors Marchiando JF, Kopanski JJ Journal of Vacuum Science & Technology B, 22(1), 411, 2004 |
| 5 |
PSPICE analysis of a scanning capacitance microscope sensor Buh GH, Tran C, Kopanski JJ Journal of Vacuum Science & Technology B, 22(1), 417, 2004 |
| 6 |
Comparison of experimental and theoretical scanning capacitance microscope signals and their impact on the accuracy of determined two-dimensional carrier profiles Kopanski JJ, Marchiando JF, Rennex BG Journal of Vacuum Science & Technology B, 20(5), 2101, 2002 |
| 7 |
Carrier concentration dependence of the scanning capacitance microscopy signal in the vicinity of p-n junctions Kopanski JJ, Marchiando JF, Rennex BG Journal of Vacuum Science & Technology B, 18(1), 409, 2000 |
| 8 |
Limitations of the calibration curve method for determining dopant profiles from scanning capacitance microscope measurements Marchiando JF, Kopanski JJ, Albers J Journal of Vacuum Science & Technology B, 18(1), 414, 2000 |
| 9 |
Scanning capacitance microscopy measurement of two-dimensional dopant profiles across junctions Kopanski JJ, Marchiando JF, Berning DW, Alvis R, Smith HE Journal of Vacuum Science & Technology B, 16(1), 339, 1998 |
| 10 |
Model database for determining dopant profiles from scanning capacitance microscope measurements Marchiando JF, Kopanski JJ, Lowney JR Journal of Vacuum Science & Technology B, 16(1), 463, 1998 |