검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Heat capacities, entropies, and Gibbs free energies of formation of low-k amorphous Si(O)CH dielectric films and implications for stability during processing Chen JW, Calvin J, Asplund M, King SW, Woodfield BF, Navrotsky A Journal of Chemical Thermodynamics, 128, 320, 2019 |
| 2 |
Synthesis and optimization of low-pressure chemical vapor deposition-silicon nitride coatings deposited from SiHCl3 and NH3 Cossou B, Jacques S, Couegnat G, King SW, Li L, Lanford WA, Bhattarai G, Paquette M, Chollon G Thin Solid Films, 681, 47, 2019 |
| 3 |
Thermodynamics of amorphous SiN(O)H dielectric films synthesized by plasma-enhanced chemical vapor deposition Chen JW, Niu M, Calvin J, Asplund M, King SW, Woodfield BF, Navrotsky A Journal of the American Ceramic Society, 101(5), 2017, 2018 |
| 4 |
Thermodynamic Stability of Low-k Amorphous SiOCH Dielectric Films Chen JW, King SW, Muthuswamy E, Koryttseva A, Wu D, Navrotsky A Journal of the American Ceramic Society, 99(8), 2752, 2016 |
| 5 |
Tuning the properties of a complex disordered material: Full factorial investigation of PECVD-grown amorphous hydrogenated boron carbide Nordell BJ, Keck CL, Nguyen TD, Caruso AN, Purohit SS, Lanford WA, Dutta D, Gidley D, Henry P, King SW, Paquette MM Materials Chemistry and Physics, 173, 268, 2016 |
| 6 |
Valence band offset and Schottky barrier at amorphous boron and boron carbide interfaces with silicon and copper King SW, French M, Xu GH, French B, Jaehnig M, Bielefeld J, Brockman J, Kuhn M Applied Surface Science, 285, 545, 2013 |
| 7 |
Tailored amorphous silicon carbide barrier dielectrics by nitrogen and oxygen doping Matsuda Y, King SW, Dauskardt RH Thin Solid Films, 531, 552, 2013 |
| 8 |
X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H/Cu Interfaces King SW, French M, Bielefeld J, Jaehnig M, Kuhn M, French B Electrochemical and Solid State Letters, 14(12), H478, 2011 |
| 9 |
Thermal conductivity and sound velocity measurements of plasma enhanced chemical vapor deposited a-SiC:H thin films Hondongwa DB, Olasov LR, Daly BC, King SW, Bielefeld J Thin Solid Films, 519(22), 7895, 2011 |
| 10 |
Simple bond energy approach for non-destructive measurements of the fracture toughness of brittle materials King SW, Antonelli GA Thin Solid Films, 515(18), 7232, 2007 |