검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
Tubular Flame Combustion for Nanoparticle Production Hirano T, Kikkawa J, Rinaldi FG, Kitawaki K, Shimokuri D, Tanabe E, Ogi T Industrial & Engineering Chemistry Research, 58(17), 7193, 2019 |
| 2 |
AgFeOF2: A Fluorine-Rich Perovskite Oxyfluoride Takeiri F, Yamamoto T, Hayashi N, Hosokawa S, Arai K, Kikkawa J, Ikeda K, Honda T, Otomo T, Tassel C, Kimoto K, Kageyama H Inorganic Chemistry, 57(11), 6686, 2018 |
| 3 |
Formation and optical properties of Ge films grown on Si(111) substrates using nanocontact epitaxy Tanaka K, Nakamura Y, Yamasaka S, Kikkawa J, Sakai T, Sakai A Applied Surface Science, 325, 170, 2015 |
| 4 |
Nanometer-thick V2O5 sheets on aluminum foil for an additive-free positive electrode of lithium-ion batteries Kikkawa J, Kitta M, Kohyama M Chemical Physics Letters, 592, 56, 2014 |
| 5 |
Cross-sectional X-ray microdiffraction study of a thick AlN film grown on a trench-patterned AlN/alpha-Al2O3 template (vol 381, pg 37, 2013) Khan DT, Takeuchi S, Kikkawa J, Nakamura Y, Miyake H, Hiramatsu K, Imai Y, Kimura S, Sakata O, Sakai A Journal of Crystal Growth, 388, 150, 2014 |
| 6 |
Formation mechanism of peculiar structures on vicinal Si(110) surfaces Yamashita M, Nakamura Y, Sugimoto R, Kikkawa J, Izunome K, Sakai A Applied Surface Science, 267, 53, 2013 |
| 7 |
Structural analysis of vicinal Si(110) surfaces with various off-angles Yamashita M, Nakamura Y, Yamamoto A, Kikkawa J, Izunome K, Sakai A Applied Surface Science, 267, 136, 2013 |
| 8 |
Cross-sectional X-ray microdiffraction study of a thick AlN film grown on a trench-patterned AlN/alpha-Al2O3 template Khan DT, Takeuchi S, Kikkawa J, Nakamura Y, Miyake H, Hiramatsu K, Imai Y, Kimura S, Sakata O, Sakai A Journal of Crystal Growth, 381, 37, 2013 |
| 9 |
Electrical characterization of wafer-bonded Ge(111)-on-insulator substrates using four-point-probe pseudo-metal-oxide-semiconductor field-effect transistor method Minami K, Nakamura Y, Yamasaka S, Yoshitake O, Kikkawa J, Izunome K, Sakai A Thin Solid Films, 520(8), 3232, 2012 |
| 10 |
Vertical dislocations in Ge films selectively grown in submicron Si windows of patterned substrates Harada S, Kikkawa J, Nakamura Y, Wang G, Caymax M, Sakai A Thin Solid Films, 520(8), 3245, 2012 |