검색결과 : 7건
No. | Article |
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1 |
High-kappa TiCeO MIM Capacitors with a Dual-Plasma Interface Treatment Cheng CH, Hsu HH, Hsieh IJ, Deng CK, Chin A, Yeh FS Electrochemical and Solid State Letters, 13(4), H112, 2010 |
2 |
Thermal leakage improvement by using a high-work-function ni electrode in high-kappa TiHfO metal-insulator-metal capacitors Chiang KC, Huang CC, Pan HC, Hsiao CN, Lin JW, Hsieh IJ, Cheng CH, Chou CP, Chin A, Hwang HL, McAlister SP Journal of the Electrochemical Society, 154(3), G54, 2007 |
3 |
Very high density (44 fF/mu m(2)) SrTiO3 MIM capacitors for RF applications Chiang KC, Lin JW, Pan HC, Hsiao CN, Chen WJ, Kao HL, Hsieh IJ, Chin A Journal of the Electrochemical Society, 154(3), H214, 2007 |
4 |
The strong degradation of 30 angstrom gate oxide integrity contaminated by copper Lin YH, Chen YC, Chan KT, Pan FM, Hsieh IJ, Chin A Journal of the Electrochemical Society, 148(4), F73, 2001 |
5 |
Cu contamination effect in oxynitride gate dielectrics Lin YH, Pan FM, Liao YC, Chen YC, Hsieh IJ, Chin A Journal of the Electrochemical Society, 148(11), G627, 2001 |
6 |
Enhanced Electron-Emission from Phosphorus-Doped and Boron-Doped Diamond-Clad Si Field Emitter Arrays Ku TK, Chen SH, Yang CD, She NJ, Tarntair FG, Wang CC, Chen CF, Hsieh IJ, Cheng HC Thin Solid Films, 290-291, 176, 1996 |
7 |
Growth of Znga2O4 Phosphor by Radio-Frequency Magnetron Sputtering Hsieh IJ, Feng MS, Kuo KT, Lin P Journal of the Electrochemical Society, 141(6), 1617, 1994 |