검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Sputtering behavior and evolution of depth resolution upon low energy ion irradiation of GaAs Hopstaken MJP, Gordon MS, Pfeiffer D, Sadana DK, Topuria T, Rice PM, Gerl C, Richter M, Marchiori C Journal of Vacuum Science & Technology B, 28(6), 1287, 2010 |
| 2 |
Quantitative prediction of junction leakage in bulk-technology CMOS devices Duffy R, Heringa A, Venezia VC, Loo J, Verheijen MA, Hopstaken MJP, van der Tak K, de Potter M, Hooker JC, Meunier-Beillard P, Delhougne R Solid-State Electronics, 54(3), 243, 2010 |
| 3 |
Quantitative measurements of two-dimensional ultrashallow B profiles in Si by selective chemical etching Scalese S, La Magna A, Italia M, Pannitteri S, Privitera V, Duffy R, Hopstaken MJP Journal of the Electrochemical Society, 152(4), G277, 2005 |
| 4 |
Impurity redistribution due to recrystallization of preamorphized silicon Duffy R, Venezia VC, van der Tak K, Hopstaken MJP, Maas GCJ, Roozeboom F, Tamminga Y, Dao T Journal of Vacuum Science & Technology B, 23(5), 2021, 2005 |
| 5 |
Effects of crystalline regrowth on dopant profiles in prearnorphized silicon Hopstaken MJP, Tamminga Y, Verheijen MA, Duffy R, Venezia VC, Heringa A Applied Surface Science, 231-2, 688, 2004 |
| 6 |
Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF Rostam-Khani P, Hopstaken MJP, Vullings P, Noij G, O'Halloran O, Claassen W Applied Surface Science, 231-2, 720, 2004 |
| 7 |
Influence of preamorphization and recrystallization on indium doping profiles in silicon Duffy R, Venezia VC, Heringa A, Pawlak BJ, Hopstaken MJP, Tamminga Y, Dao T, Roozeboom F, Wang CC, Diaz CH, Griffin PB Journal of Vacuum Science & Technology B, 22(3), 865, 2004 |
| 8 |
Quantitative depth profiling of SiOxNy layers on Si van Berkum JGM, Hopstaken MJP, Snijders JHM, Tamminga Y, Cubaynes FN Applied Surface Science, 203, 414, 2003 |
| 9 |
Quantification of lateral repulsion between coadsorbed CO and N on Rh(100) using temperature-programmed desorption, low-energy electron diffraction, and Monte Carlo simulations van Bavel AP, Hopstaken MJP, Curulla D, Niemantsverdriet JW, Lukkien JJ, Hilbers PAJ Journal of Chemical Physics, 119(1), 524, 2003 |
| 10 |
CO/Rh(111): Vibrational frequency shifts and lateral interactions in adsorbate layers Linke R, Curulla D, Hopstaken MJP, Niemantsverdriet JW Journal of Chemical Physics, 115(17), 8209, 2001 |