검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Focused ion beam tomography of a microelectronic device with sub-2-nm resolution Yeoh TS, Ives NA, Presser N, Stupian GW, Leung MS, McCollum JL, Hawley FW Journal of Vacuum Science & Technology B, 25(3), 922, 2007 |
| No. | Article |
|---|---|
| 1 |
Focused ion beam tomography of a microelectronic device with sub-2-nm resolution Yeoh TS, Ives NA, Presser N, Stupian GW, Leung MS, McCollum JL, Hawley FW Journal of Vacuum Science & Technology B, 25(3), 922, 2007 |