검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Correlation between texture and mechanical stress durability of thin aluminum films Nussl R, Jewula T, Ruile W, Sulima T, Hansch W Thin Solid Films, 556, 376, 2014 |
| 2 |
Growth of highly textured aluminum films on LiTaO3 with optimized titanium intermediate layers Nussl R, Senft C, Beckmeier D, Jewula T, Ruile W, Sulima T, Hansch W, Eisele I Thin Solid Films, 519(22), 8154, 2011 |
| 3 |
Scaling properties of the tunneling field effect transistor (TFET): Device and circuit Nirschl T, Henzler S, Fischer J, Fulde M, Bargagli-Stoffi A, Sterkel M, Sedlmeir J, Weber C, Heinrich R, Schaper U, Einfeld J, Neubert R, Feldmann U, Stahrenberg K, Ruderer E, Georgakos G, Huber A, Kakoschke R, Hansch W, Schmitt-Landsiedel D Solid-State Electronics, 50(1), 44, 2006 |
| 4 |
Complementary tunneling transistor for low power application Wang PF, Hilsenbeck K, Nirschl T, Oswald M, Stepper C, Weis M, Schmitt-Landsiedel D, Hansch W Solid-State Electronics, 48(12), 2281, 2004 |
| 5 |
Simulation of the Esaki-tunneling FET Wang PF, Nirschl T, Schmitt-Landsiedel D, Hansch W Solid-State Electronics, 47(7), 1187, 2003 |
| 6 |
Ag metallization with high electromigration resistance for ULSI Hauder M, Hansch W, Gstottner J, Schmitt-Landsiedel D Solid-State Electronics, 47(7), 1227, 2003 |
| 7 |
Enhancement of device performance in vertical sub-100 nm MOS devices due to local channel doping Fink C, Anil KG, Geiger H, Hansch W, Kaesen F, Schulze J, Sulima T, Eisele I Solid-State Electronics, 46(3), 387, 2002 |
| 8 |
Dopant diffusion during rapid thermal oxidation Stadler A, Sulima T, Schulze J, Fink C, Kottantharayil A, Hansch W, Baumgartner H, Eisele I, Lerch W Solid-State Electronics, 44(5), 831, 2000 |
| 9 |
Vertical MOS-gated pin-diodes: MOS-gated tunneling transistors in Si(100) and Si(111) Schulze J, Fink C, Sulima T, Eisele I, Hansch W Thin Solid Films, 380(1-2), 154, 2000 |
| 10 |
MBE-grown vertical power-MOSFETs with 100-nm channel length Fink C, Anil KG, Hansch W, Sedlmaier S, Schulze J, Eisele I Thin Solid Films, 380(1-2), 207, 2000 |