검색결과 : 24건
| No. | Article |
|---|---|
| 1 |
Tensile strain engineering of Si thin films using porous Si substrates Boucherif A, Blanchard NP, Regreny P, Marty O, Guillot G, Grenet G, Lysenko V Thin Solid Films, 518(9), 2466, 2010 |
| 2 |
Conductance deep-level transient spectroscopy study of 1 mu m gate length 4H-SiC MESFETs Gassoumi M, Bluet JM, Dermoul I, Maaref H, Guillot G, Morvan E, Dua C, Brylinski C Solid-State Electronics, 50(2), 214, 2006 |
| 3 |
Using silicon nanostructures for the improvement of silicon solar cells efficiency De la Torre J, Bremond G, Lemiti M, Guillot G, Mur P, Buffet N Thin Solid Films, 511, 163, 2006 |
| 4 |
Hole-like Defects in n-Channel 4H-SIC MESFETs Observed by Current Transient Spectroscopy Bluet JM, Gassoumi M, Dermoul I, Chekir F, Maaref H, Guillot G, Morvan E, Dua C, Brylinski C Materials Science Forum, 483, 865, 2005 |
| 5 |
Ground and first excited states observed in silicon nanocrystals by photocurrent technique De la Torre J, Souifi A, Poncet A, Bremond G, Guillot G, Garrido B, Morante JR Solid-State Electronics, 49(7), 1112, 2005 |
| 6 |
Optical characterization of full SiC wafer El Harrouni I, Bluet JM, Ziane D, Mermoux M, Baillet F, Guillot G Materials Science Forum, 457-460, 593, 2004 |
| 7 |
Deep level investigation by current and capacitance transient spectroscopy in 4H-SiC MESFETs on semi-insulating substrates. Gassoumi M, Sghaier N, Dermoul I, Chekir F, Maaref H, Bluet JM, Guillot G, Morvan E, Noblanc O, Dua C, Brylinski C Materials Science Forum, 457-460, 1185, 2004 |
| 8 |
Characterizations of SiC/SiO2 interface quality toward high power MOSFETs realization Ziane D, Bluet JM, Guillot G, Godignon P, Monserrat J, Ciechonski R, Syvajarvi M, Yakimova R, Chen L, Mawby P Materials Science Forum, 457-460, 1281, 2004 |
| 9 |
Aspects of the photopolymerization of a commercial dental resin studied by H-1 magnetic resonance imaging Guillot G, Nunes TG, Ruaud JP, Polido W Polymer, 45(16), 5525, 2004 |
| 10 |
UV photoreflectance for wide band gap nitride characterization Bru-Chevallier C, Fanget S, Guillot G, Ruffenach S, Briot O Thin Solid Films, 450(1), 75, 2004 |