검색결과 : 10건
No. | Article |
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1 |
Optical properties and charge transport of textured Sc2O3 thin films obtained by atomic layer deposition Lebedev MS, Kruchinin VN, Afonin MY, Korolkov IV, Saraev AA, Gismatulin AA, Gritsenko VA Applied Surface Science, 478, 690, 2019 |
2 |
Structure, chemistry and luminescence properties of dielectric LaxHf1-xOy films Kaichev VV, Smirnova TP, Yakovkina LV, Ivanova EV, Zamoryanskaya MV, Saraev AA, Pustovarov VA, Perevalov TV, Gritsenko VA Materials Chemistry and Physics, 175, 200, 2016 |
3 |
Oxygen vacancy in Al2O3: Photoluminescence study and first-principle simulation Pustovarov VA, Perevalov TV, Gritsenko VA, Smirnova TP, Yelisseyev AP Thin Solid Films, 519(19), 6319, 2011 |
4 |
The charge transport mechanism in silicon nitride: Multi-phonon trap ionization Vishnyakov AV, Novikov YN, Gritsenko VA, Nasyrov KA Solid-State Electronics, 53(3), 251, 2009 |
5 |
Accurate ellipsometric measurement of refractive index and thickness of ultrathin oxide film Ayupov BM, Gritsenko VA, Wong H, Kim CW Journal of the Electrochemical Society, 153(12), F277, 2006 |
6 |
Bonding and band offset in N2O-grown oxynitride Gritsenko VA, Wong H, Kwok WM, Xu JB Journal of Vacuum Science & Technology B, 21(1), 241, 2003 |
7 |
A new low voltage fast SONOS memory with high-k dielectric Gritsenko VA, Nasyrov KA, Novikov YN, Aseev AL, Yoon SY, Lee JW, Lee EH, Kim CW Solid-State Electronics, 47(10), 1651, 2003 |
8 |
Valence band offset at silicon/silicon nitride and silicon nitride/silicon oxide interfaces Gritsenko VA, Shaposhnikov AV, Kwok WM, Wong H, Jidomirov GM Thin Solid Films, 437(1-2), 135, 2003 |
9 |
Study of excess silicon at Si3N4 thermal SiO2 interface using ellipsometric measurements Gritsenko VA, Svitasheva SN, Petrenko IP, Wong H, Xu JB, Wilson IH Journal of the Electrochemical Society, 146(2), 780, 1999 |
10 |
Silicon dots/clusters in silicon nitride: photoluminescence and electron spin resonance Gritsenko VA, Zhuravlev KS, Milov AD, Wong H, Kwok RWM, Xu JB Thin Solid Films, 353(1-2), 20, 1999 |