화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Optical properties and charge transport of textured Sc2O3 thin films obtained by atomic layer deposition
Lebedev MS, Kruchinin VN, Afonin MY, Korolkov IV, Saraev AA, Gismatulin AA, Gritsenko VA
Applied Surface Science, 478, 690, 2019
2 Structure, chemistry and luminescence properties of dielectric LaxHf1-xOy films
Kaichev VV, Smirnova TP, Yakovkina LV, Ivanova EV, Zamoryanskaya MV, Saraev AA, Pustovarov VA, Perevalov TV, Gritsenko VA
Materials Chemistry and Physics, 175, 200, 2016
3 Oxygen vacancy in Al2O3: Photoluminescence study and first-principle simulation
Pustovarov VA, Perevalov TV, Gritsenko VA, Smirnova TP, Yelisseyev AP
Thin Solid Films, 519(19), 6319, 2011
4 The charge transport mechanism in silicon nitride: Multi-phonon trap ionization
Vishnyakov AV, Novikov YN, Gritsenko VA, Nasyrov KA
Solid-State Electronics, 53(3), 251, 2009
5 Accurate ellipsometric measurement of refractive index and thickness of ultrathin oxide film
Ayupov BM, Gritsenko VA, Wong H, Kim CW
Journal of the Electrochemical Society, 153(12), F277, 2006
6 Bonding and band offset in N2O-grown oxynitride
Gritsenko VA, Wong H, Kwok WM, Xu JB
Journal of Vacuum Science & Technology B, 21(1), 241, 2003
7 A new low voltage fast SONOS memory with high-k dielectric
Gritsenko VA, Nasyrov KA, Novikov YN, Aseev AL, Yoon SY, Lee JW, Lee EH, Kim CW
Solid-State Electronics, 47(10), 1651, 2003
8 Valence band offset at silicon/silicon nitride and silicon nitride/silicon oxide interfaces
Gritsenko VA, Shaposhnikov AV, Kwok WM, Wong H, Jidomirov GM
Thin Solid Films, 437(1-2), 135, 2003
9 Study of excess silicon at Si3N4 thermal SiO2 interface using ellipsometric measurements
Gritsenko VA, Svitasheva SN, Petrenko IP, Wong H, Xu JB, Wilson IH
Journal of the Electrochemical Society, 146(2), 780, 1999
10 Silicon dots/clusters in silicon nitride: photoluminescence and electron spin resonance
Gritsenko VA, Zhuravlev KS, Milov AD, Wong H, Kwok RWM, Xu JB
Thin Solid Films, 353(1-2), 20, 1999