화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Alternative environmental friendly process for dehydration of edible Undaria pinnatifida brown seaweed by microwave hydrodiffusion and gravity
Lopez-Hortas L, Gely M, Falque E, Dominguez H, Torres MD
Journal of Food Engineering, 261, 15, 2019
2 Neutral mass spectrometry of virus capsids above 100 megadaltons with nanomechanical resonators
Dominguez-Medina S, Fostner S, Defoort M, Sansa M, Stark AK, Halim MA, Vernhes E, Gely M, Jourdan G, Alava T, Boulanger P, Masselon C, Hentz S
Science, 362(6417), 918, 2018
3 Frequency fluctuations in silicon nanoresonators
Sansa M, Sage E, Bullard EC, Gely M, Alava T, Colinet E, Naik AK, Villanueva LG, Duraffourg L, Roukes ML, Jourdan G, Hentz S
Nature Nanotechnology, 11(6), 552, 2016
4 Compact heterodyne NEMS oscillator for sensing applications
Sansa M, Gourlat G, Jourdan G, Gely M, Villard P, Sicard G, Hentz S
Solid-State Electronics, 125, 214, 2016
5 Investigation of charge-trap memories with AlN based band engineered storage layers
Molas G, Colonna JP, Kies R, Belhachemi D, Bocquet M, Gely M, Vidal V, Brianceau P, Martinez E, Papon AM, Licitra C, Vandroux L, Ghibaudo G, De Salvo B
Solid-State Electronics, 58(1), 68, 2011
6 Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories
Bocquet M, Molas G, Perniola L, Garros X, Buckley J, Gely M, Colonna JP, Grampeix H, Martin F, Vidal V, Toffoli A, Deleonibus S, Ghibaudo G, Pananakakis G, De Salvo B
Solid-State Electronics, 53(7), 786, 2009
7 Investigation of hafnium-aluminate alloys in view of integration as interpoly dielectrics of future Flash memories
Molas G, Bocquet M, Buckley J, Grampeix H, Gely M, Colonna JP, Licitra C, Rochat N, Veyront T, Garros X, Martin F, Brianceau P, Vidal V, Bongiorno C, Lombardo S, De Salvo B, Deleonibus S
Solid-State Electronics, 51(11-12), 1540, 2007
8 Single-electron phenomena in ultra-scaled floating-gate devices and their impact on electrical characteristics
Deleruyelle D, Molas G, DeSalvo B, Gely M, Lafond D
Solid-State Electronics, 49(11), 1728, 2005
9 Investigation of SiO2/HfO2 gate stacks for application to non-volatile memory devices
Buckley J, De Salvo B, Ghibaudo G, Gely M, Damlencourt JF, Martin F, Nicotra G, Deleonibus S
Solid-State Electronics, 49(11), 1833, 2005