화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Optical and structural characterization of Ge clusters embedded in ZrO2
Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P
Applied Surface Science, 421, 283, 2017
2 Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions
Agocs E, Kozma P, Nador J, Hamori A, Janosov M, Kalas B, Kurunczi S, Fodor B, Ehrentreich-Forster E, Fried M, Horvath R, Petrik P
Applied Surface Science, 421, 289, 2017
3 Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires
Fodor B, Defforge T, Agocs E, Fried M, Gautier G, Petrik P
Applied Surface Science, 421, 397, 2017
4 Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method
Fodor B, Kozma P, Burger S, Fried M, Petrik P
Thin Solid Films, 617, 20, 2016
5 Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride
Fodor B, Cayrel F, Agocs E, Alquier D, Fried M, Petrik P
Thin Solid Films, 571, 567, 2014
6 Resolving lateral and vertical structures by ellipsometry using wavelength range scan
Petrik P, Agocs E, Volk J, Lukacs I, Fodor B, Kozma P, Lohner T, Oh S, Wakayama Y, Nagata T, Fried M
Thin Solid Films, 571, 579, 2014
7 Approaches to calculate the dielectric function of ZnO around the band gap
Agocs E, Fodor B, Pollakowski B, Beckhoff B, Nutsch A, Jank M, Petrik P
Thin Solid Films, 571, 684, 2014
8 Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
Petrik P, Gumprecht T, Nutsch A, Roeder G, Lemberger M, Juhasz G, Polgar O, Major C, Kozma P, Janosov M, Fodor B, Agocs E, Fried M
Thin Solid Films, 541, 131, 2013
9 Optical Models for the Characterization of Silica Nanosphere Monolayers Prepared by the Langmuir-Blodgett Method Using Ellipsometry in the Quasistatic Regime
Kozma P, Fodor B, Deak A, Petrik P
Langmuir, 26(20), 16122, 2010
10 Coalbed gas in the Mecsek Basin, Hungary
Landis ER, Rohrbacher TJ, Barker CE, Fodor B, Gombar G
International Journal of Coal Geology, 54(1-2), 41, 2003