검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Onset and recovery of electrical instabilities in conducting double-layer dielectric films Evseev S, Cacciato A Journal of the Electrochemical Society, 152(2), F15, 2005 |
| 2 |
Independence of the soft breakdown phenomenon from the gate material - Soft- vs. hard-gate capacitors Cacciato A, Evseev S Journal of the Electrochemical Society, 149(10), F149, 2002 |
| 3 |
Evolution from soft to hard breakdown in thin gate oxides: effect of oxide thickness, capacitor area and stress current Cacciato A, Evseev S, Valk H Solid-State Electronics, 45(8), 1339, 2001 |
| 4 |
Assessment of thin gate oxide quality by fast turnaround soft-probe measurements Cacciato A, Evseev S Journal of the Electrochemical Society, 146(9), 3403, 1999 |
| 5 |
Fast-feedback iron contamination monitoring using surface photovoltage measurements Cacciato A, Vleeshouwers S, Evseev S Journal of the Electrochemical Society, 145(2), 701, 1998 |