검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Optical characterization of full SiC wafer El Harrouni I, Bluet JM, Ziane D, Mermoux M, Baillet F, Guillot G Materials Science Forum, 457-460, 593, 2004 |
| 2 |
Epitaxial growth of 4H-SiC with hexamethyldisilane HMDS Sartel C, Souliere V, Dazord J, Monteil Y, El-Harrouni I, Bluet JM, Guillot G Materials Science Forum, 389-3, 263, 2002 |
| 3 |
Characterization of homoepitaxial 4H-SiC layer grown from silane/propane system Sartel C, Bluet JM, Souliere V, El-Harrouni I, Monteil Y, Mermoux M, Guillot G Materials Science Forum, 433-4, 165, 2002 |
| 4 |
Investigation of defects in 4H-SiC by synchrotron topography, Raman spectroscopy imaging and photoluminescence spectroscopy imaging Pernot E, El Harrouni I, Mermoux M, Bluet JM, Anikin M, Chaussende D, Pons M, Madar R Materials Science Forum, 433-4, 265, 2002 |
| 5 |
Application of UV scanning photoluminescence spectroscopy for minority carrier lifetime mapping Masarotto L, Bluet JM, El Harrouni I, Guillot G Materials Science Forum, 433-4, 349, 2002 |