1 |
A THz-range planar NDR device utilizing ballistic electron acceleration in GaN Aslan B, Eastman LF Solid-State Electronics, 64(1), 57, 2011 |
2 |
Direct-write composition patterning of InGaN by focused thermal beam during molecular-beam epitaxy Chen X, Schaff WJ, Eastman LF Journal of Vacuum Science & Technology B, 25(3), 974, 2007 |
3 |
C-doped semi-insulating GaNHFETs on sapphire substrates with a high breakdown voltage and low specific on-resistance Choi YC, Shi J, Pophristic M, Spencer MG, Eastman LF Journal of Vacuum Science & Technology B, 25(6), 1836, 2007 |
4 |
Fabrication and characterization of high breakdown voltage AlGaN/GaN heterojunction field effect transistors on sapphire substrates Choi YC, Pophristic M, Peres B, Spencer MG, Eastman LF Journal of Vacuum Science & Technology B, 24(6), 2601, 2006 |
5 |
Low-resistance Ohmic contacts developed on undoped AlGaN/GaN-based high electron mobility transistors with AlN interlayer Sun YJ, Eastman LF Journal of Vacuum Science & Technology B, 24(6), 2723, 2006 |
6 |
Important Role of Parasitic Regions in Electrical Characteristics of SiC MESFETs Cha HY, Choi YC, Eastman LF, Spencer MG, Ardaravicius L, Matulionis A, Kiprijanovic O Materials Science Forum, 483, 861, 2005 |
7 |
Investigation of multiple carrier effects in InN epilayers using variable magnetic field Hall measurements Swartz CH, Tompkins RP, Giles NC, Myers TH, Lu H, Schaff WJ, Eastman LF Journal of Crystal Growth, 269(1), 29, 2004 |
8 |
Effects of a molecular beam epitaxy grown AlN passivation layer on AlGaN/GaN heterojunction field effect transistors Hwang JH, Schaff WJ, Green BM, Cha HY, Eastman LF Solid-State Electronics, 48(2), 363, 2004 |
9 |
Elimination of current instability and improvement of RF power performance usingSi(3)N(4) passivation in SiC lateral epitaxy MESFETs Cha HY, Choi YC, Konstantinov AO, Harris CI, Ericsson P, Eastman LF, Spencer MG Solid-State Electronics, 48(7), 1233, 2004 |
10 |
Effects of transparent Pt metal layer on performance of InGaN/GaN multiple-quantum well light-emitting diodes Huh C, Schaff WJ, Eastman LF, Park SJ Electrochemical and Solid State Letters, 6(6), G79, 2003 |