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| No. | Article |
|---|---|
| 1 |
Structural and Electronic Effects of Argon Sputtering and Reactive Ion Etching on In0.53Ga0.47As and In0.52Al0.48As Studied by Inelastic Light-Scattering Maslar JE, Dorsten JF, Bohn PW, Agarwala S, Adesida I, Caneau C, Bhat R Journal of Vacuum Science & Technology B, 13(3), 988, 1995 |