화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Growth and characterization of epitaxial Ti3GeC2 thin films on 4H-SiC(0001)
Buchholt K, Eklund P, Jensen J, Lu J, Ghandi R, Domeij M, Zetterling CM, Behan G, Zhang H, Spetz AL, Hultman L
Journal of Crystal Growth, 343(1), 133, 2012
2 Doping of electrochemically etched pore arrays in n-type silicon: Processing and electrical characterization
Badel X, Domeij M, Linnros J
Journal of the Electrochemical Society, 152(4), G252, 2005
3 Current gain of 4H-SiC bipolar transistors including the effect of interface states
Domeij M, Danielsson E, Lee HS, Zetterling CM, Ostling M
Materials Science Forum, 483, 889, 2005
4 Electrical characteristics of 4H-SiC BJTs at elevated temperatures
Lee HS, Domeij M, Danielsson E, Zetterling CM, Ostling M
Materials Science Forum, 483, 897, 2005
5 A 4H-SiC BJT with an epitaxially regrown extrinsic base layer
Danielsson E, Domeij M, Lee HS, Zetterling CM, Ostling M, Schoner A, Hallin C
Materials Science Forum, 483, 905, 2005
6 Comparison between implanted and epitaxial pin-diodes on 4H-silicon carbide
Zimmermann U, Domeij M, Hallen A, Ostling M
Materials Science Forum, 457-460, 1037, 2004
7 Extrinsic base design of SiC bipolar transistors
Danielsson E, Domeij M, Zetterling CM, Ostling M, Schoner A
Materials Science Forum, 457-460, 1117, 2004
8 Simulation study of 4H-SiC junction-gated MOSFETs from 300 K to 773 K
Lee HS, Koo SM, Zetterling CM, Danielsson E, Domeij M, Ostling M
Materials Science Forum, 457-460, 1437, 2004
9 Investigation of thermal properties in fabricated 4H-SiC high power bipolar transistors
Danielson E, Zetterling CM, Domeij M, Ostling M, Forsberg U, Janzen E
Solid-State Electronics, 47(4), 639, 2003
10 Measurement and device simulation of avalanche breakdown in high-voltage 4H-SiC diodes including the influence of macroscopic defects
Domeij M, Brunahl H, Ostling M
Materials Science Forum, 389-3, 1277, 2002