화학공학소재연구정보센터
검색결과 : 7건
No. Article
1 Progress in Z(2)-FET 1T-DRAM: Retention time, writing modes, selective array operation, and dual bit storage
Wan J, Le Royer C, Zaslavsky A, Cristoloveanu S
Solid-State Electronics, 84, 147, 2013
2 Structure and property changes of ZrO2/Al2O3/ZrO2 laminate induced by low-temperature NH3 annealing applicable to metal-insulator-metal capacitor
Li MY, Tsai BS, Jiang PC, Wu HC, Wu YH, Lin YJ
Thin Solid Films, 518(18), 5272, 2010
3 Innovating SOI memory devices based on floating-body effects
Bawedin M, CristoloveanU S, Flandre D
Solid-State Electronics, 51(10), 1252, 2007
4 New TIT capacitor with ZrO2/Al2O3/ZrO2 dielectrics for 60 nm and below DRAMs
Cho HJ, Kim YD, Park DS, Lee E, Park CH, Jang JS, Lee KB, Kim HW, Ki YJ, Han K, Song YW
Solid-State Electronics, 51(11-12), 1529, 2007
5 Fully integrated 512 Mb DRAMs with HSG-merged-AHO cylinder capacitor
Kim SG, Hyun CS, Park D, Cho TH, Suk JG, Hong HS, Lee KY, Oh KS
Solid-State Electronics, 50(6), 1030, 2006
6 Evolution of materials technology for stacked-capacitors in 65 nm embedded-DRAM
Gerritsen E, Emonet N, Caillat C, Jourdan N, Piazza M, Fraboulet D, Boeck B, Berthelot A, Smith S, Mazoyer P
Solid-State Electronics, 49(11), 1767, 2005
7 Characterization and leakage current density of radio frequency magnetron sputtered nanocrstalline SrTiO3 thin films
Wang MC, Hsiao FY, Wu NC
Journal of Crystal Growth, 264(1-3), 271, 2004